Results 1 to 10 of about 14,565 (118)
Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs [PDF]
This paper systematically investigates the thermal failure mechanisms of 14 nm Ferro-FinFETs using the TCAD tools, incorporating both Preisach and thermodynamic models.
Wenxuan Ma +8 more
doaj +2 more sources
We have investigated the thermoelectric properties of the 3C, 2H, 4H, and 6H polytypes of the wide-band-gap(n-type) semiconductors SiC, GaN, and ZnO based on first-principles calculations and Boltzmann transport theory.
Zheng Huang +3 more
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We experimentally demonstrate ferroelectric-like non-volatile field-effect transistor (NVFET) with the amorphous Al2O3 gate insulator for artificial synapse applications.
Yue Peng +9 more
doaj +1 more source
ZnS/ZnO heterostructure semiconductor: A promising ionic liquid media approach without calcination [PDF]
ZnS is a wide band gap semiconductor with excellent optical and electrical properties whose electronic structure can be modified with other semiconductors.
Shabnam Sheshmani +3 more
doaj +1 more source
Synaptic Behaviors in Ferroelectric-Like Field-Effect Transistors with Ultrathin Amorphous HfO2 Film
We demonstrate a non-volatile field-effect transistor (NVFET) with a 3-nm amorphous HfO2 dielectric that can simulate the synaptic functions under the difference and repetition of gate voltage (V G) pulses.
Yue Peng +5 more
doaj +1 more source
1 kW MHz Wideband Class E Power Amplifier
Class E power amplifiers are widely used in high-frequency applications due to their simplicity and use of only one ground-referenced switch. However, Class E power amplifiers are usually tuned to operate at a fixed frequency due to their resonant nature.
Jiale Xu, Zikang Tong, Juan Rivas-Davila
doaj +1 more source
Hydrogen-terminated diamond field-effect transistor with a bilayer dielectric of HfSiON/Al2O3
The fabrication of a single-crystal hydrogen-terminated diamond metal-oxide-semiconductor field-effect transistor (MOSFET) with HfSiON/Al2O3 bilayer dielectric has been carried out. HfSiON and Al2O3 layers were deposited by sputtering-deposition (SD) and
Jibran Hussain +5 more
doaj +1 more source
Compared with silicon‐based Insulated Gate Bipolar Transistors (IGBTs), silicon carbide (SiC) Metal‐Oxide‐Semiconductor Field‐Effect Transistors (MOSFETs) are characterized by higher operating temperatures, switching speeds and switching frequencies, and
Bufan Shi +6 more
doaj +1 more source
FEM thermal analysis of Cu/diamond/Cu and diamond/SiC heat spreaders
The effects of thermal stress resulting from thermal cooling in copper/diamond/copper heat spreader is investigated using finite element method. A similar model of diamond/SiC heat spreader is compared without addition of interlayer.
Garuma Abdisa Denu +4 more
doaj +1 more source
Effect of thermoelastic damping on silicon, GaAs, diamond and SiC micromechanical resonators
The effect of thermoelastic damping as a main dissipation mechanism in single crystalline silicon, GaAs, diamond, SiC and SiO2 micromechanical resonators are studied.
Garuma Abdisa Denu +4 more
doaj +1 more source

