Results 231 to 240 of about 584,809 (267)

Accurate and efficient evaluation of circuit yield and yield gradients

1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers, 2002
A method is described for estimating the yield and yield gradient based on a priori geometric approximation of the acceptability region in the disturbance space. Circuit performance macromodeling is used to construct the acceptability region approximation.
Peter Feldmann, Stephen W. Director
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Computing parametric yield accurately and efficiently

1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers, 2002
An algorithm for computing parametric yield is presented. The algorithm uses statistical modeling techniques and takes advantage of incremental knowledge of the problem to reduce significantly the number of simulations needed. Polynomial regression is used to construct simple equations mapping parameters to measurements.
Linda Milor, Alberto L. Sangiovanni-Vincentelli   +1 more
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Growth Yield and Efficiency in Chemosynthetic Microorganisms

Annual Review of Microbiology, 1978
INTRODUCTION .. . .. . . ... ... . . . . ... .. . . 156 EXAMINATION OF PREDICTIVE FACTORS ......... . ....... ... . . . . . . . . . . . . . . . . . . . ... ... . . . . . . . . .
W J, Payne, W J, Wiebe
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An efficient algorithm for statistical timing yield optimization

Proceedings of the 52nd Annual Design Automation Conference, 2015
Statistical timing yield optimization algorithms require computation of yield-gradient for gate resizing in every iteration. Numerical yield-gradients account for the effects of fan-in and fan-out gates, but are computationally expensive. In this paper, we formulate a more accurate analytical expression for the yield-gradient (termed effective yield ...
S. Ramprasath 0001, Vinita Vasudevan
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Improving efficiency of breeding for higher crop yield

Theoretical and Applied Genetics, 1993
Exclusive selection for yield raises, the harvest index of self-pollinated crops with little or no gain in total bipmass. In addition to selection for yield, it is suggested that efficient breeding for higher yield requires simultaneous selection for yield's three major, genetically controlled physiological components.
D H, Wallace, J P, Baudoin, J, Beaver, D P, Coyne, D E, Halseth, P N, Masaya, H M, Munger, J R, Myers, M, Silbernagel, K S, Yourstone, R W, Zobel   +10 more
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A novel approach for efficient crop yield prediction

Computers and Electronics in Agriculture, 2019
Abstract Crop yield prediction is one of the challenging task in agricultural domain. Extensive research in agricultural domain has been carried out to predict better crop yield using the machine learning algorithm Artificial Neural Network (ANN) and statistical model Multiple Linear Regression (MLR).
Maya Gopal P. S., R. Bhargavi
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Critical Mass, Efficiency, and Yield

2021
This chapter forms the heart of this book. Every gram of enriched uranium or synthesized plutonium produced in the Manhattan Project was obtained at great cost and with great difficulty, so estimating the amount of fissile material needed to make a workable nuclear weapon—the so-called critical mass—was a crucial issue for the developers of Little Boy ...
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The compatibililty - yield efficiency relationship [PDF]

, 2005
At the last INGENIC seminar, one of the questions raised concerned the relations between yield efficiency and compatibility. As a contribution to this knowledge, we describe results from a study of phenotypic correlations beween the two descriptors, based on individual observation data from a hybrid comparative trial in Ivory Coast.
Lachenaud, Philippe, Sounigo, Olivier, Clément, Didier   +2 more
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Efficiency of One‐Replicate Yield Testing

Journal of Production Agriculture, 1990
Conducting yield trials at multiple locations is an essential component of breeding programs that develop crop cultivars with stable performance across a broad range of growing conditions. Recognition that grower acceptance relates closely to stable crop performance has led to the implementation of testing programs that sample a large number of ...
S. M. Dofing, C. A. Francis
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Efficient Grouping of Fail Chips for Volume Yield Diagnostics

2009 22nd International Conference on VLSI Design, 2009
Volume Yield Diagnostics (VYD) is crucial to diagnose critical systematic yield issues from the reports obtained by testing thousands of chips. This paper presents an efficient clustering technique for VYD that has been shown to work successfully both in the simulation environment as well as on real industrial failure data.
Lavanya Jagan, Ratan Deep Singh, V. Kamakoti 0001, Ananta K. Majhi   +3 more
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