Results 211 to 220 of about 583,000 (268)

Trait-Based Optimization of Plant Density in Drip-Fertigated Wheat: Yield Formation and Nitrogen-Radiation-Water Use Efficiency Responses of Varieties Contrasting in Individual Spike Productivity. [PDF]

Plants (Basel)
Zhou X, Qian M, Wang F, Gao D, Zhao G, Wang S, Wang D, Hu X.   +7 more
europepmc   +1 more source

Effect of Fertilization and Row Spacing on the Performance of Nettle (<i>Urtica dioica</i> L.) Under Mediterranean Conditions. [PDF]

Plants (Basel)
Mavroeidis A, Stavropoulos P, Roussis I, Karydogianni S, Papadopoulos G, Kallergi S, Chatzitriantafyllou M, Pachi V, Beslemes D, Tigka E, Kakabouki I, Bilalis D.   +11 more
europepmc   +1 more source

Projected Changes in Yield and Water Use Efficiency of Cold-Region Rice and the Role of CO₂ Under Climate Change. [PDF]

Plants (Basel)
Li Z, Liu Y, Nie T, Xiao X, Guo H, Wang T, Han Y.   +6 more
europepmc   +1 more source

Effects of maize plant type and row width in ginger/maize intercropping system on yield, economy, and interspecific competition. [PDF]

Front Plant Sci
Tian A, Liu L, Zhang H, He R, Liu J, Sun G, Huang Q, Long S, Yang B, Yan X, Zhang M, Ren Y, Li Q.   +12 more
europepmc   +1 more source

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Yield and Collection Efficiency

The International Journal of Artificial Organs, 1993
Yield and collection efficiency are two important and strictly related aspects of an apheresis system. We have examined the various formulas, dwelling upon a few particular aspects of the collection of platelets, granulocytes and stem cells.
D, Dimonte, L, Cazzato, G, Poliseno, N, Paglionico   +3 more
openaire   +2 more sources

Efficient Non-Monte-Carlo Yield Estimation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022
Parametric yield estimation is a critical component in the Integrated Circuit design flow. We propose an efficient non-Monte-Carlo yield estimation method. Key is the use of sensitivity information efficiently obtained with the nominal circuit response.
Zhengqi Gao, Ron Rohrer
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Accurate and efficient evaluation of circuit yield and yield gradients

1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers, 2002
A method is described for estimating the yield and yield gradient based on a priori geometric approximation of the acceptability region in the disturbance space. Circuit performance macromodeling is used to construct the acceptability region approximation.
Peter Feldmann, Stephen W. Director
openaire   +1 more source