Results 201 to 210 of about 1,500,059 (236)
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Read Retry Mechanism for 3D NAND Flash Memory: Observations, Analyses, and Solutions
IEEE Non-Volatile Memory System and Applications SymposiumThe read retry mechanism is implemented in high-density NAND flash memory to recover data when the default read reference voltage fails to read out the data.
Han-Yu Liao +3 more
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Some Comprehensive Understanding of 3D-NAND Technology (Invited)
2018 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA), 2018this paper reviews some recent 3D NAND development based on published work related to its technology, process, devices and reliability.
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Achieving Near-Zero Read Retry for 3D NAND Flash Memory
International Conference on Architectural Support for Programming Languages and Operating SystemsAs the flash-based storage devices age with program/erase (P/E) cycles, they require an increasing number of read retries for error correction, which in turn deteriorates their read performance.
Min Ye +7 more
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13.7 A 1Tb Density 3b/Cell 3D-NAND Flash on a 2YY-Tier Technology with a 300MB/s Write Throughput
IEEE International Solid-State Circuits ConferenceWith the recent evolution of AI, our digital world, constructed by networks, is advancing rapidly and driving demand for data bandwidth and transfer speed everywhere from mobiles to data centers, regardless of form factor.
K. Kawai +32 more
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Carbon Plug Application in 3D NAND Fabrication
2022 IEEE International Interconnect Technology Conference (IITC), 2022Yu-Chih Chang +6 more
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Extending SSD Lifetime via Balancing Layer Endurance in 3D NAND Flash Memory
Design, Automation and Test in EuropeBy stacking layers vertically, 3D flash memory enables continuous growth in capacity. In this paper, we study the layer variation in 3D flash blocks and find that bottom layer pages exhibit the lowest endurance, whereas middle layer pages demonstrate the
Siyi Huang, Yajuan Du, Yi Fan, Cheng Ji
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Error Generation for 3D NAND Flash Memory
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022Weihua Liu +4 more
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3D NAND Scaling in the next decade
2022 International Electron Devices Meeting (IEDM), 2022Russ Meyer +2 more
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