Results 1 to 10 of about 696 (160)

Architectural and Integration Options for 3D NAND Flash Memories [PDF]

open access: yesComputers, 2017
Nowadays, NAND Flash technology is everywhere, since it is the core of the code and data storage in mobile and embedded applications; moreover, its market share is exploding with Solid-State-Drives (SSDs), which are replacing Hard Disk Drives (HDDs) in ...
Rino Micheloni   +2 more
exaly   +7 more sources

3D NAND Flash Based on Planar Cells [PDF]

open access: yesComputers, 2017
In this article, the transition from 2D NAND to 3D NAND is first addressed, and the various 3D NAND architectures are compared. The article carries out a comparison of 3D NAND architectures that are based on a “punch-and-plug” process—with gate-all ...
Andrea Silvagni
exaly   +5 more sources

Architecture and Process Integration Overview of 3D NAND Flash Technologies

open access: yesApplied Sciences (Switzerland), 2021
In the past few decades, NAND flash memory has been one of the most successful nonvolatile storage technologies, and it is commonly used in electronic devices because of its high scalability and reliable switching properties.
Geun Ho Lee, Sungmin Hwang, Junsu Yu
exaly   +4 more sources

Channel Modeling and Quantization Design for 3D NAND Flash Memory

open access: yesEntropy, 2023
As the technology scales down, two-dimensional (2D) NAND flash memory has reached its bottleneck. Three-dimensional (3D) NAND flash memory was proposed to further increase the storage capacity by vertically stacking multiple layers.
Cheng Wang   +5 more
doaj   +4 more sources

Characterizing 3D Floating Gate NAND Flash

open access: yesACM Transactions on Storage, 2018
As both NAND flash memory manufacturers and users are turning their attentions from planar architecture towards three-dimensional (3D) architecture, it becomes critical and urgent to understand the characteristics of 3D NAND flash memory.
Qin Xiong, Fei Wu, Zhonghai Lu
exaly   +3 more sources

A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories [PDF]

open access: yesMicromachines, 2021
Data randomization has been a widely adopted Flash Signal Processing technique for reducing or suppressing errors since the inception of mass storage platforms based on planar NAND Flash technology.
Michele Favalli   +4 more
doaj   +5 more sources

Dielectric Engineering to Suppress Cell-to-Cell Programming Voltage Interference in 3D NAND Flash Memory

open access: yesMicromachines, 2021
In contrast to conventional 2-dimensional (2D) NAND flash memory, in 3D NAND flash memory, cell-to-cell interference stemming from parasitic capacitance between the word-lines (WLs) is difficult to control because the number of WLs, achieved for better ...
Woo-Jin Jung, Jun-Young Park
doaj   +2 more sources

Random Telegraph Noise in 3D NAND Flash Memories [PDF]

open access: yesMicromachines, 2021
In this paper, we review the phenomenology of random telegraph noise (RTN) in 3D NAND Flash arrays. The main features of such arrays resulting from their mainstream integration scheme are first discussed, pointing out the relevant role played by the ...
Alessandro S. Spinelli   +3 more
doaj   +3 more sources

Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices

open access: yesComputers, 2017
We review the state-of-the-art in the understanding of planar NAND Flash memory reliability and discuss how the recent move to three-dimensional (3D) devices has affected this field.
Alessandro S Spinelli   +2 more
exaly   +3 more sources

Self-Adaption of the GIDL Erase Promotes Stacking More Layers in 3D NAND Flash

open access: yesMicromachines, 2023
The bit density is generally increased by stacking more layers in 3D NAND Flash. Gate-induced drain leakage (GIDL) erase is a critical enabler in the future development of 3D NAND Flash.
Tao Yang   +4 more
doaj   +2 more sources

Home - About - Disclaimer - Privacy