Results 131 to 140 of about 3,221,776 (178)

Thermal Testing of Analogue Integrated Circuits: A Case Study

Journal of Electronic Testing, 2003
This paper discusses the use of temperature as a test observable for analogue circuits, presenting a generic configuration for analogue circuit thermal testing. As a case study, static temperature analysis is performed over a two-stage operational amplifier in view of extracting temperature waveforms at different locations on the circuit under test ...
Josep Altet, André Ivanov, A. Wong
openaire   +2 more sources

Simulation of the test process for analogue integrated circuits

1996 IEEE International Symposium on Circuits and Systems (ISCAS), 1996
The paper describes a new implementation of testing-algorithm model for analogue and mixed-signal circuits with neural network evaluation. The simulation system is programmable (different fault models, input stimuli, and different analyses), it covers a wide spectrum of test methods and desired post-process techniques.
J. Povazanec, V. Musil, J. Kaderka
openaire   +1 more source

Into the fast lane [analogue integrated circuits]

Engineering & Technology, 2008
The paper presents the steps in dealing shrinking voltages in analogue circuit design. Cost pressures are forcing designers to put more analogue circuitry onto bleeding-edge silicon.
openaire   +1 more source

Electrothermal Simulation of Analogue Integrated Circuits With Ets

1997
Nowadays, high-power devices are integrated together with complex digital and high performance analogue circuits on the same chip. Inappropriate design and/or layout cause major problems with maximum temperature and temperature gradients between components.
W. van Petegem, B. Geeraerts, W. Sansen
openaire   +1 more source

Neural network based system for testing and diagnostics of analogue integrated circuits

Proceedings of Third International Conference on Electronics, Circuits, and Systems, 2002
The paper describes a new implementation of testing-algorithm model for analogue and mixed-signal circuits with neural network evaluation. The simulation system is programmable (different fault models, input stimuli, and different analyses), it covers a wide spectrum of test methods and desired post-process techniques.
Jirí Kaderka, Vladislav Musil, Juraj Povazanec, Petr Simek   +3 more
openaire   +1 more source

Future of Analogue Integrated Circuit Design

1993
Analogue integrated circuit design has played an important role in the development of integrated circuit technology. As the level of integration increased in integrated circuit technology, digital circuit implementation became more desirable than analogue circuit implementation because of its robustness and simplicity of design. However, an all-digital
openaire   +1 more source

High Temperature Digital and Analogue Integrated Circuits in Silicon Carbide

Materials Science Forum, 2013
Silicon Carbide devices are capable of operating as a semiconductor at high temperatures and this capability is being exploited today in discrete power components, bringing system advantages such as reduced cooling requirements [1]. Therefore there is an emerging need for control ICs mounted on the same modules and being capable of operating at the ...
R.A.R. Young, David T. Clark, Jennifer D. Cormack, A.E. Murphy, Dave A. Smith, Robin. F. Thompson, Ewan P. Ramsay, S. Finney   +7 more
openaire   +1 more source

Gallium Arsenide Analogue Integrated Circuit Design Techniques

1993
Modern communication systems, both microwave and optical, are beginning to rely heavily on the high frequency circuit performance capabilities provided by III-V semiconductor materials, of which the most mature is Gallium Arsenide (GaAs). The applications of GaAs can be divided into digital and analogue.The analogue applications can be further ...
Chris Toumazou, David Haigh
openaire   +1 more source

Sizing Analogue Integrated Circuits by Integer Encoding and NSGA-II

IETE Technical Review, 2017
ABSTRACTTraditional sizing approaches for analogue integrated circuits (ICs) consisting of metal-oxide-semiconductor field-effect transistors manipulate real values for the widths (W) and lengths (L), thus requiring a post-processing step to round them to multiples of lambda, i.e. the IC fabrication technology.
A. C. Sanabria-Borbón, E. Tlelo-Cuautle
openaire   +1 more source

Parametric yield enhancement of analogue integrated circuits: a new approach

1991 IEEE International Symposium on Circuits and Systems (ISCAS), 1991
Two algorithms for the parametric yield enhancement of analog ICs have been developed. Those parameters which are under the designer's control are geometric in nature and are collectively represented by a point in geometric space (G-space) whose axes are typically device widths. The aim of the yield enhancement algorithm is to move the point in G-space
M. Singha, R. Spence
openaire   +1 more source