Results 201 to 210 of about 4,121 (265)

π-Electron reorganization in polycyclic aromatic hydrocarbons toward BT.2020-compliant narrowband red emitters. [PDF]

Natl Sci Rev
Li J, Li P, Wang Y, Yin J, Bin Z, You J.
europepmc   +1 more source

High-frequency, low-energy organic event-based sensors for closed-loop neurostimulation. [PDF]

Nat Sens
Yang CY, Zhao Z, Wu HY, Gao D, Huang JD, Ji J, Xiong M, Liu T, Harikesh PC, Marks A, Wang XY, Massetti M, Shao S, Pei J, McCulloch I, Berggren M, Tu D, Gelinas J, Khodagholy D, Fabiano S.   +19 more
europepmc   +1 more source

Radiation Hardened LIDAR Sensor: Conceptual Design, Testing, and Performance Evaluation. [PDF]

Sensors (Basel)
Jonasson ET, Kuhlmann C, Wood C, Skilton R.   +3 more
europepmc   +1 more source

Miniaturisation of Raman spectroscopy systems: from benchtop to backpocket.

Lab Chip
Hardy M, Kanade PP, Buchan E, Goldberg Oppenheimer P, McPolin CPT, Bowman RM.   +5 more
europepmc   +1 more source

Some of the next articles are maybe not open access.

Related searches:

Statistical and behavioural modelling of analogue integrated circuits

IEE Proceedings, Part G: Circuits, Devices and Systems, 1993
A full statistical model for the behavioural parameters of an analogue cell is presented. The parameter variations with respect to manufacturing tolerances are approximated by response surfaces which allow the mean, standard deviation, correlation of parameter pairs and the actual distribution to be estimated.
P Y K Cheung
exaly   +2 more sources

Electrical characterization of analogue and RF integrated circuits by thermal measurements

Microelectronics Journal, 2007
This paper presents a novel technique for measuring the electrical characteristics of analogue circuits, based on measuring the temperature at the silicon surface close to the circuit under test. As a detailed example, the paper analyses how the gain of an amplifier can be observed through temperature measurements.
Diego Mateo, Josep Altet
exaly   +2 more sources

A design for testability approach for nano-CMOS analogue integrated circuits

International Journal of Electronics, 2013
Dependability requirements must be considered from the beginning when designing safety-critical systems. Therefore, testing should even be considered earlier, intertwined with the design process. The process of designing for better testability is called design for testability (DfT).
Belgacem Hamdi, Ka Lok Man, Rached Tourki   +2 more
exaly   +2 more sources

Integrated circuits for analogue systems

Microelectronics Reliability, 1973
Because of the need for a large market and the initial problems with technically complex circuits, integrated circuits developed later for analogue than for digital systems. There are now two reasonably distinct groups of analogue circuits, namely those for professional use and those for incorporation in consumer equipment.In the former category ...
openaire   +2 more sources

GaAs sampled-analogue integrated circuits

Journal of the Institution of Electronic and Radio Engineers, 1987
Sampled-analogue design technique is a rather neglected area of GaAs i. e. exploitation which has a wide range of potential applications in the area of high performance filtering through the use of the techniques described here. Although many other devices such as analogue to digital converters (ADCs) properly fall within the scope of this paper, they ...
J.A. Phillips, S.J. Harrold, G.K. Barker
openaire   +1 more source

Analogue integrated circuits electrothermal modelling

Experience of Designing and Applications of CAD Systems in Microelectronics. Proceedings of the VI-th International Conference. CADSM 2001 (IEEE Cat. No.01 EX473), 2002
Recent models of electronic devices included in most popular simulation programs hardly simulate the thermal effects. It is possible only to set the fixed temperature of the entire die to consider the influence of equal temperature on the electric parameters of those devices.
S. Bieganski, A. Napieralski
openaire   +1 more source