Results 11 to 20 of about 19,628,440 (150)

Comprehensive Investigation of Truncated Fin GaN FinFET for Improved Analog/RF Performance

open access: yesIEEE Open Journal of Nanotechnology
This work presents an analysis of the performance of Gallium Nitride Truncated Fin FinFETs (GaN-TF-FinFET) and compares them with conventional (C) FinFET, TF-FinFET, and silicon-on-insulator (SOI) TF-FinFET in analog and RF applications by using advanced
Praween Kumar Srivastava   +2 more
doaj   +2 more sources

Оценка влияния параметров структуры FinFET на электрические характеристики средствами TCAD-моделирования [PDF]

open access: yes, 2022
Using TCAD modeling, the effect of changing FinFET structure parameters, such as gate stack layer sizes, rib shape, or doping levels, on the electrical characteristics of the device is investigated.С помощью TCAD-моделирования исследовано влияние ...
Д. С. Силкин   +5 more
core   +1 more source

chanjunaa/FinFET-Device-Discovery: First release of FinFET-Device-Discovery

open access: yes, 2023
This is the first release of FinFET-Device ...
chanjunaa
core   +1 more source

Thermal modeling of RF FinFET PAs through temperature-dependent X-parameters extracted from physics-based simulations [PDF]

open access: yes, 2022
FinFET RF technology is increasingly investigated for the deployment of 5G communication systems and beyond. Thermal management represents one of the main problems that must be addressed for the successful design of FinFET-based microwave power ...
Guerrieri, S. Donati   +7 more
core   +1 more source

Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type [PDF]

open access: yes, 2017
This paper represents the temperature effect on FinFET transistor and the possibility of using it as a temperature nano-sensor. The MuGFET simulation tool was used to investigate temperature characteristics of the FinFET.
Hashim, Yasir, Yasir Hashim
core   +1 more source

A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS [PDF]

open access: yes, 2022
This work describes a comparative radiation reliability analysis between two reconfigurable devices with different manufacturing technology: 28 nm CMOS-based and 16 nm FinFET based FPGAs.
C. De Sio   +4 more
core   +1 more source

Comparative Study of Novel u-Shaped SOI FinFET Against Multiple-Fin Bulk/SOI FinFET

open access: yes, 2023
Superior scalability and better gate-to-channel capacitive coupling can be achieved with adopting gate-all-around (GAA) device architecture. However, compared against FinFET device structure, the GAA device is not very cost-effective.
Hyoung Won Baac   +3 more
core   +1 more source

Performance assessment of InGaAs–SOI–FinFET for enhancing switching capability using high-k dielectric

open access: yesMemories - Materials, Devices, Circuits and Systems
In this work, a high-k In0.53Ga0.47As silicon-on-insulator FinFET (InGaAs–SOI–FinFET) is presented for high-switching and ultra-low power applications at 7 nm gate length.
Priyanka Agrwal, Ajay Kumar
doaj   +1 more source

Comprehensive analysis of In0.53Ga0.47As SOI-FinFET for enhanced RF/wireless performance

open access: yesFrontiers in Electronics
This paper comprehensively analyses the RF (Radio Frequency) and wireless performance characteristics of high-k In0.53Ga0.47As silicon-on-insulator FinFET (InGaAs-SOI-FinFET).
Priyanka Agrwal, Ajay Kumar
doaj   +1 more source

High-k dielectrics on (100) and (110) n-InAs: Physical and electrical characterizations

open access: yesAIP Advances, 2014
Two high-k dielectric materials (Al2O3 and HfO2) were deposited on n-type (100) and (110) InAs surface orientations to investigate physical properties of the oxide/semiconductor interfaces and the interface trap density (Dit).
C. H. Wang   +18 more
doaj   +1 more source

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