Results 21 to 30 of about 562 (143)

A 7-nm-Based 5R4W High-Timing Reliability Regfile Circuit

open access: yesIET Circuits, Devices and Systems, 2023
Register file (Regfile), as the bottleneck circuit for processor data interaction, directly determines the computing performance of the system. To address the read/write conflict and timing error problems of register heap, this paper proposes a 5R4W high-
Wanlong Zhao   +3 more
doaj   +1 more source

Limits on Fundamental Limits to Computation [PDF]

open access: yes, 2014
An indispensable part of our lives, computing has also become essential to industries and governments. Steady improvements in computer hardware have been supported by periodic doubling of transistor densities in integrated circuits over the last fifty ...
Markov, Igor L.
core   +1 more source

Micromachining [PDF]

open access: yes, 2021
To present their work in the field of micromachining, researchers from distant parts of the world have joined their efforts and contributed their ideas according to their interest and engagement. Their articles will give you the opportunity to understand

core   +1 more source

Ge FinFET CMOS Inverters With Improved Channel Surface Roughness by Using In-Situ ALD Digital O3 Treatment

open access: yesIEEE Journal of the Electron Devices Society, 2018
Improved electrical characteristics of CMOS inverters composed of Ge n- and p-finFETs were demonstrated by utilizing newly introduced Ge surface treatments.
M.-S. Yeh   +18 more
doaj   +1 more source

Low Power FinFET based SRAM Cell Design [PDF]

open access: yes, 2016
With the incessant developments occurring in VLSI circuits and systems arena and power dissipation becoming a major design constraint, the power component can be considerably reduced through efficient designing of the SRAM memory elements.
, Ayon Manna, Sudarshan Patil, V S Kanchana Bhaaskaran
core   +2 more sources

Performance Analysis of FinFET Based Inverter circuit, NAND and NOR Gate at 22nm and 14nm Node technologies. [PDF]

open access: yes, 2015
The size of integrated devices such as PC, mobiles etc are reducing day by day with multiple operations, all of these is happening because of the scaling down the size of MOSFETs which is the main component in memory, processors and so on.
, Raju Hajare, Sunil C, Sumanth Jain P R, Anish Kumar A R, Sriram AS
core   +2 more sources

Fin Field Effect Transistors Performance in Analog and RF for High-k Dielectrics [PDF]

open access: yes, 2011
The high-k is needed to replace SiO2 as the gate dielectric to reduce the gate leakage current. The impact of a high-k gate dielectric on the device short channel performance and scalability of nanoscale double gate Fin Field Effect Transistors (FinFET ...
Kumar, P. Vijaya, Nirmal, D.
core   +2 more sources

Diamond FinFET without Hydrogen Termination

open access: yesScientific Reports, 2018
In this letter we report the first diamond fin field-effect transistor (diamond FinFET) without a hydrogen-terminated channel. The device operates with hole accumulation by metal-oxide-semiconductor (MOS) structures built on fins to maintain effective ...
Biqin Huang   +3 more
doaj   +1 more source

Low-Power And High Performance Of An Optimized FinFET Based 8T SRAM Cell Design [PDF]

open access: yes, 2019
The development of the nanotechnology leadsto the shrinking of the size of the transistors to nanometerregion. However, there are a lot of challenges due to sizescaling of the transistors such as short channel effects (SCEs)and threshold voltage roll-off
A. Riyadi, Munawar   +4 more
core   +2 more sources

Low power area efficient self-gated flip flop: Design, implementation and analysis in emerging devices

open access: yesEngineering and Applied Science Research, 2022
This study presents a novel CMOS self-gated flip flop for low power and area efficient applications. The low power operations are achieved by deactivating the clock signal when not required in the circuit.
Owais Ahmad Shah   +2 more
doaj  

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