Results 221 to 230 of about 50,543 (262)

Optical capacitance-voltage characterization of charge traps in the trapping nitride layer of charge trapped flash memory devices

Applied Physics Letters, 2007
Extracting the trap distribution in charge trapping layers of charge trap flash memory devices, an optical C-V method (OCVM) is proposed. Applying photons with λ=532nm to the oxide-nitride-oxide layer with 50∕60∕23Å in metal-oxide-nitride-oxide-semiconductor charge trap flash devices, the trap density in the charge trapping nitride layer is extracted ...
Jang Uk. Lee, Kang Seob Roh, Gu Cheol Kang, Seung Hwan Seo, Kwan Young Kim, Sunyeong Lee, Kwan Jae Song, Chang Min Choi, So Ra Park, Jun Hyun Park, Ki Chan Jeon, Dae Hwan Kim, Byung-Gook Park, Jong Duk Lee, Dong Myong Kim   +14 more
openaire   +1 more source

Trapped Charged Particles

2015
no ...
Knoop, Martina, Madsen, Niels, Thompson, Richard C   +2 more
openaire   +2 more sources

Investigation of charge trap and loss characteristics for charge trap memory by electrostatic force microscopy

2011 11th Annual Non-Volatile Memory Technology Symposium Proceeding, 2011
In this work, we employ the electrostatic force microscopy (EFM) technique to investigate the charge trapping and loss properties of Hf-based trapping structures by contact potential differences (CPDs) measurement. For different samples, the electron densities after injection and after 2 hours retention time are extracted from the measured CPDs.
Chenxin Zhu, Rong Yang, Zongliang Huo, Zhongguang Xu, Dongxia Shi, Jing Liu, Guangyu Zhang, Ming Liu   +7 more
openaire   +1 more source

Overview of charge trapping memory devices—charge trapping layer engineering

2020
Ammar Nayfeh, Nazek El-Atab
openaire   +1 more source

Charge Trapping in Polymers

Journal of The Electrochemical Society, 1973
D. K. Davies, P. J. Lock
openaire   +1 more source

Unraveling the Dynamics of Charge Trapping and De-Trapping in Ferroelectric FETs

IEEE Transactions on Electron Devices, 2022
Nilotpal Choudhury, Ravi Tiwari, Kai Ni   +2 more
exaly  

Remarkably Enhanced Charge Density of Inorganic Material Via Regulating Contact Barrier Difference and Charge Trapping for Triboelectric Nanogenerator

Advanced Functional Materials, 2023
Chenguo Hu
exaly  

Charge‐Carrier Trapping and Radiative Recombination in Metal Halide Perovskite Semiconductors

Advanced Functional Materials, 2020
Henry Snaith, Laura Herz, Michael Johnston   +2 more
exaly  

Trapped Charge Dating

2021
openaire   +1 more source

Intermediate nanofibrous charge trapping layer-based wearable triboelectric self-powered sensor for human activity recognition and user identification

Nano Energy, 2023
Kumar Shrestha, Trilochan Bhatta, Sudeep Sharma   +2 more
exaly