Results 1 to 10 of about 22,416,589 (293)

Charging Phenomena at the Interface Between High-k Dielectrics and SiOx Interlayers

open access: yesJournal of Telecommunications and Information Technology, 2023
The transition regions of GdSiO/SiOx and HfO2/SiOx interfaces have been studied with the high-k layers deposited on silicon substrates. The existence of transition regions was verified by medium energy ion scattering (MEIS) data and transmission ...
Olof Engström   +8 more
doaj   +3 more sources

The impact of multi-layered dielectrics on the electrical performance of ZnO thin-film transistors

open access: yesScientific African, 2023
The electrical performance of ZnO thin film transistors (TFTs) fabricated on three different dielectric layers is investigated using an inverted staggered bottom gate thin film transistor structure.
Divine Khan Ngwashi, Thomas Attia Mih
doaj   +1 more source

Review and perspective of high-k dielectrics on silicon

open access: yesJournal of Telecommunications and Information Technology, 2023
The paper reviews recent work in the area of high-k dielectrics for application as the gate oxide in advanced MOSFETs. Following a review of relevant dielectric physics, we discuss challenges and issues relating to characterization of the dielectrics ...
Stephe Hall   +4 more
doaj   +1 more source

Dielectric relaxation of high-k oxides [PDF]

open access: yesNanoscale Research Letters, 2013
Frequency dispersion of high-k dielectrics was observed and classified into two parts: extrinsic cause and intrinsic cause. Frequency dependence of dielectric constant (dielectric relaxation), that is the intrinsic frequency dispersion, could not be characterized before considering the effects of extrinsic frequency dispersion.
Zhao, Chun   +4 more
openaire   +2 more sources

Comparison of gate leakage current components in metal-insulator-semiconductor structures with high-k gate dielectrics

open access: yesJournal of Telecommunications and Information Technology, 2001
Numerical simulations of the gate leakage current in metal-insulator-semiconductor (MIS) structures based on the transfer matrix approach were carried out.
Tomasz Janik   +2 more
doaj   +1 more source

Dual-Point Technique for Multi-Trap RTN Signal Extraction

open access: yesIEEE Access, 2020
Random telegraph noise (RTN), as one dominant variation source in the ultra-scaled devices, has been attracting much more attention, and its analysis is of great importance to understand the fundamental physical mechanisms.
Xuepeng Zhan   +5 more
doaj   +1 more source

Peculiarities of the interface between high-permittivity dielectrics and semiconductors

open access: yesFrontiers in Materials, 2014
Replacement of the silicon dioxide thin films in metal-oxide-semiconductor structures for microelectronics with high permittivity dielectrics (high-k) is a crucial step in the further down-scaling of microelectronic devices.
Nenad eNovkovski
doaj   +1 more source

Double dielectrics enhancement on the LDMOS using high-k field dielectric and low-k buried dielectric

open access: yesResults in Physics, 2022
This paper investigates the double dielectrics enhancement LDMOS (DDE LDMOS) with high-k field dielectric and low-k buried dielectric. The analytical models of the potential and electric field, optimal breakdown voltage and drift doping concentration are
Jiafei Yao   +8 more
doaj   +1 more source

High K Low Loss Dielectrics Co-Fireable with LTCC

open access: yesActive and Passive Electronic Components, 2002
Rapid growth in the application of LTCC technology for RF wireless is clearly driven by the trend of miniaturization and mobile communication systems. This technology provides the possibility of integration of passive components in a cost effective way ...
Christina Modes   +2 more
doaj   +1 more source

Surface‐coated polymer nanocomposites containing z‐aligned high‐k nanowires as high‐performance dielectrics at elevated temperatures

open access: yesIET Nanodielectrics, 2023
Recently, demands for high‐performance polymer film capacitors at elevated temperatures have become more urgent. High dielectric constant is essential for dielectric materials to achieve substantial energy density at relatively low electric fields, which
Sang Cheng   +5 more
doaj   +1 more source

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