Results 1 to 10 of about 4,299,511 (195)

All-Water-Driven High-k HfO2 Gate Dielectrics and Applications in Thin Film Transistors [PDF]

open access: yesNanomaterials, 2023
In this article, we used a simple, non-toxic, environmentally friendly, water-driven route to fabricate the gate dielectric on the Si substrate and successfully integrate the In2O3/HfO2 thin film transistor (TFT).
Fakhari Alam   +3 more
doaj   +2 more sources

1200V 4H-SiC MOSFET with a High-K Source Gate for Improving Third-Quadrant and High Frequency Figure of Merit Performance [PDF]

open access: yesMicromachines
This paper proposes a 1200V 4H-SiC MOSFET incorporating a High-K dielectric-integrated fused source-gate (HKSG) structure, engineered to concurrently enhance the third-quadrant operation and high-frequency figure of merit (HF-FOM).
Mingyue Li   +5 more
doaj   +2 more sources

Organoleptic evaluation of Ladakhi churpe enriched with apricot and spinach [PDF]

open access: yesJournal of Veterinary and Animal Sciences, 2022
Dried dairy products viz. churpe-balls and churpe-strips were developed with the incorporation of apricot powder into cottage cheese at different levels (05, 10, 15 and 20%) and spinach powder at levels 03, 06, 09 and 12 percent, respectively.
Anwar Hussain   +4 more
doaj   +1 more source

Charging Phenomena at the Interface Between High-k Dielectrics and SiOx Interlayers

open access: yesJournal of Telecommunications and Information Technology, 2023
The transition regions of GdSiO/SiOx and HfO2/ SiOx interfaces have been studied with the high-k layers deposited on silicon substrates. The existence of transition regions was verified by medium energy ion scattering (MEIS) data and transmission ...
Olof Engström   +8 more
doaj   +3 more sources

Methodology for the Simulation of the Variability of MOSFETs With Polycrystalline High-k Dielectrics Using CAFM Input Data

open access: yesIEEE Access, 2021
In this work, a simulation methodology, whose inputs are Conductive Atomic Force Microscope (CAFM) experimental data, is proposed to evaluate the impact of nanoscale variability sources related to the polycrystallization of high-k dielectrics (i.e ...
A. Ruiz   +5 more
doaj   +1 more source

Understanding the Origin of Metal Gate Work Function Shift and Its Impact on Erase Performance in 3D NAND Flash Memories

open access: yesMicromachines, 2021
We studied the metal gate work function of different metal electrode and high-k dielectric combinations by monitoring the flat band voltage shift with dielectric thicknesses using capacitance–voltage measurements.
Sivaramakrishnan Ramesh   +10 more
doaj   +1 more source

Memristors with Nociceptor Characteristics Using Threshold Switching of Pt/HfO2/TaOx/TaN Devices

open access: yesNanomaterials, 2022
As artificial intelligence technology advances, it is necessary to imitate various biological functions to complete more complex tasks. Among them, studies have been reported on the nociceptor, a critical receptor of sensory neurons that can detect ...
Minsu Park   +3 more
doaj   +1 more source

Improvement in Self-Heating Characteristic by Incorporating Hetero-Gate-Dielectric in Gate-All-Around MOSFETs

open access: yesIEEE Journal of the Electron Devices Society, 2021
For improving self-heating effects (SHEs) in gate-all-around metal-oxide-semiconductor field-effect transistors (GAA MOSFETs), hetero-gate-dielectric (HGD) is utilized. The HGD consists of hafnium dioxide (HfO2) and silicon dioxide (SiO2), which has high
Young Suh Song   +5 more
doaj   +1 more source

Electrical Performance of 28 nm-Node Varying Channel-Width nMOSFETs under DPN Process Treatments

open access: yesMicromachines, 2022
The decoupled-plasma nitridation treatment process is an effective recipe for repairing the trap issues when depositing high-k gate dielectric. Because of this effect, electrical performance is not only increased with the relative dielectric constant ...
Shou-Yen Chao   +4 more
doaj   +1 more source

Modeling of Gate Stack Patterning for Advanced Technology Nodes: A Review

open access: yesMicromachines, 2018
Semiconductor device dimensions have been decreasing steadily over the past several decades, generating the need to overcome fundamental limitations of both the materials they are made of and the fabrication techniques used to build them.
Xaver Klemenschits   +2 more
doaj   +1 more source

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