Results 51 to 60 of about 1,057 (152)

Process Temperature Control for Low Dishing in CMP. [PDF]

open access: yesMaterials (Basel)
Shin Y, Jeong J, Shin J, Jeong H.
europepmc   +1 more source

Direct Measurement of Planarization Length for Copper Chemical Mechanical Planarization Polishing (CMP) Processes Using a Large Pattern Test Mask [PDF]

open access: bronze, 2001
Paul G. LeFevre   +8 more
openalex   +1 more source

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