Precision Local Strain Engineering in 2D Semiconductors and Their van der Waals Heterostructures
This review highlights recent advances in experimental techniques for mapping and quantifying strain, strategies for imparting programmable local strain via substrate, stressor, and interlayer coupling, and strain‐engineered functionalities in electronics, photonics, and quantum devices.
Byeong Chan Kim +2 more
wiley +1 more source
This review focuses on capability of Gallium Nitride (GaN)‐based supercapacitors, bordering the advancement from porous architecture to novel hybrid nanostructures. It systematically investigates synthesis approaches and charge storage mechanisms that generate remarkable energy densities and competent cyclic stability.
Farasat Haider +7 more
wiley +1 more source
Organic Transistor‐Based Neuromorphic Electronics and Their Recent Applications
This review highlights recent progress in organic neuromorphic electronics, showing how organic semiconductors enable synaptic and neuronal functions with low power, mechanical flexibility, and biocompatibility. By bridging materials, devices, and systems, organic platforms are accelerating brain‐inspired computing toward applications in artificial ...
Ziru Wang, Feng Yan
wiley +1 more source
Pr<sub>1-<i>x</i></sub>Ca<sub><i>x</i></sub>MnO<sub>3</sub>-Based Memristive Heterostructures: Basic Mechanisms and Applications. [PDF]
Buczek M +4 more
europepmc +1 more source
Organic-inorganic hybrid piezotronic bipolar junction transistor for pressure sensing. [PDF]
Iranmanesh E +10 more
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Intrinsic Disordered Network in Multiferroic YMnO<sub>3</sub> Single Crystals for In-Materio Physical Reservoir Computing Through Tuneable Domain-Wall Structure. [PDF]
Xu M +7 more
europepmc +1 more source
Brain-Computer Interfaces Using Flexible Electronics: An a-IGZO Front-End for Active ECoG Electrodes. [PDF]
van Oosterhout K +7 more
europepmc +1 more source
Memristor-based storage system with convolutional autoencoder-based image compression network. [PDF]
Feng Y +6 more
europepmc +1 more source
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International Journal of Electronics, 2013Dependability requirements must be considered from the beginning when designing safety-critical systems. Therefore, testing should even be considered earlier, intertwined with the design process. The process of designing for better testability is called design for testability (DfT).
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Robust design of low power CMOS analogue integrated circuits
IEE Proceedings - Circuits, Devices and Systems, 2001As feature sizes move into the deep submicron ranges and power supply voltages are reduced, the effect of both device mismatch and inter-die process variations on the performance and reliability of analogue integrated circuits is magnified. The statistical MOS (SMOS) model accounts for both inter-die and intra-die variations.
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