Results 21 to 30 of about 801,069 (309)

Optimization laser parameters to simulate solar cell degradation induced by space radiation [PDF]

open access: yesINCAS Bulletin, 2021
Space radiation has a catastrophic impact on solar cells performance, appears as a degradation in their electrical and physical properties, this may cause a satellite failure; to overcome this issue, ground testing is required.
Sara AZIZ   +3 more
doaj   +1 more source

The influence of the structure of guard rings on the dark currents of silicon p-i-n photodiodes

open access: yesФізика і хімія твердого тіла, 2023
The article examines the influence of the guard rings (GR) system structure on the dark currents of responsive elements (RE) and the actual guard rings of silicon 4-element p-i-n photodiodes (PD). The samples were made on the basis of p-silicon by planar
M.S. Kukurudzіak
doaj   +1 more source

Metastable Dark Current in BRITE Nano-Satellite Image Sensors

open access: yesRemote Sensing, 2020
Dark current in charge-coupled devices (CCDs) is one of the most important sources of impulsive noise present in scientific images. While the dark current originating in the fabrication defects (mainly impurities) is stable and dependent only on ...
Adam Popowicz, Alejandro Farah
doaj   +1 more source

Photostability Improvement of Organic Photodiodes with ZnO Electron Transport Layer

open access: yesAdvanced Photonics Research, 2023
The stable performance of organic photodiodes (OPDs) is crucial for realizing reliable photosensing and their facile integration into larger systems. However, OPDs with the commonly used ZnO electron transport layer (ETL) suffer from photoinstability ...
Theodorus Jonathan Wijaya   +5 more
doaj   +1 more source

Similarities Between Proton and Neutron Induced Dark Current Distribution in CMOS Image Sensors [PDF]

open access: yes, 2012
Several CMOS image sensors were exposed to neutron or proton beams (displacement damage dose range from 4 TeV/g to 1825 TeV/g) and their radiation-induced dark current distributions are compared.
Bardoux, A.   +13 more
core   +1 more source

Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors [PDF]

open access: yes, 2012
This paper presents an investigation of Total Ionizing Dose induced dark current sources in Pinned PhotoDiodes (PPD) CMOS Image Sensors based on pixel design variations. The influence of several layout parameters is studied. Only one parameter is changed
Goiffon, Vincent   +13 more
core   +1 more source

Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors [PDF]

open access: yes, 2011
This paper presents an investigation of Total Ionizing Dose induced dark current sources in Pinned PhotoDiodes (PPD) CMOS Image Sensors based on pixel design variations. The influence of several layout parameters is studied. Only one parameter is changed
V. Goiffon   +15 more
core   +1 more source

Artwork contributed to publication 'Dark Mountain' (issue 21) [PDF]

open access: yes, 2022
Artwork contributed to publication 'Dark Mountain' (issue 21) "Our twenty-first issue revolves around the theme of confluence. The image of watersmeet, of two streams merging into one, has long had sacred connotations, as shown by the votive ...
Carter, Justin
core  

The dark Z′ and sterile neutrinos behind current anomalies

open access: yesPhysics Letters B, 2022
We show how, in the $B-L$ extension of the SM (BLSM) with an Inverse Seesaw (IS) mechanism for neutrino mass generation, a light $Z'$ state with moderate couplings to SM objects, hence `dark' in its nature, can be associated, in conjunction with light sterile neutrinos, to some present day data anomalies, such as the anomalous magnetic moment of the ...
A. Hammad, Ahmed Rashed, S. Moretti
openaire   +4 more sources

Total ionizing dose versus displacement damage dose induced dark current random telegraph signals in CMOS image sensors [PDF]

open access: yes, 2011
Dark current Random Telegraph Signals due to total ionizing dose (TID) and displacement damage dose (DDD) are investigated in CMOS image sensors.
A. Bardoux   +19 more
core   +1 more source

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