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A Review of Optical Metrology Techniques for Advanced Manufacturing Applications. [PDF]
Micromachines (Basel)Zhao F, Tang H, Zou X, Li X.
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VNA-Based Vector Reflection Coefficient Measurement Technique for Powered RF Signal Generators. [PDF]
Sensors (Basel)Cetin E +3 more
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Phase-domain all-digital phase-locked loop
IEEE Transactions on Circuits and Systems Part 2: Express Briefs, 2005A fully digital frequency synthesizer for RF wireless applications has recently been proposed. At its foundation lies a digitally controlled oscillator that deliberately avoids any analog tuning controls. When implemented in a digital deep-submicrometer CMOS process, the proposed architecture appears more advantageous over conventional charge-pump ...
Robert Bogdan Staszewski
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A Second-Order All-Digital Phase-Locked Loop
IRE Transactions on Communications Systems, 1974A simple second-order digital phase-locked loop has been designed to synchronize itself to a square-wave subcarrier. Analysis and experimental performance are given for both acquisition behavior and steady-state phase error performance. In addition, the damping factor and the noise bandwidth are derived analytically. Although all the data are given for
Jack K. Holmes, Carl R. Tegnelia
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ICASSP '78. IEEE International Conference on Acoustics, Speech, and Signal Processing, 2005
This paper deals with the design, construction and evaluation of a Digital Phase-Locked Loop. An exclusive OR gate serves as a linear phase detector. The integrator consists of a cascade of up/down decade counters. The D.C. value of each cycle from the phase detector is measured and accumulated. The rate of integration is determined by the clock input.
C. P. Reddy, Erik Fountain
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This paper deals with the design, construction and evaluation of a Digital Phase-Locked Loop. An exclusive OR gate serves as a linear phase detector. The integrator consists of a cascade of up/down decade counters. The D.C. value of each cycle from the phase detector is measured and accumulated. The rate of integration is determined by the clock input.
C. P. Reddy, Erik Fountain
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A Digital BIST for Phase-Locked Loops
2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 2008This paper presents a conceptual implementation of a jitter measurement circuit with several BIST (built-in self test) features for embedded phase-locked loops. We demonstrate a fully functional jitter measurement circuit capable of detecting cycle-to-cycle jitter.
Kevin Sliech, Martin Margala
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2018 IEEE Custom Integrated Circuits Conference (CICC), 2018
▪ Digital PLLs exploit CMOS scaling and allow accurate cancellation of fractional spurs and automatic bandwidth control ▪ In Bang-Bang DPLLs assisted by DTC, performance is only limited by DCO and DTC resolution ▪ Bang-Bang DPLLs assisted by DTC allow same phase-noise performance and fractionalspur level as standard DPLLs at much lower power ...
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▪ Digital PLLs exploit CMOS scaling and allow accurate cancellation of fractional spurs and automatic bandwidth control ▪ In Bang-Bang DPLLs assisted by DTC, performance is only limited by DCO and DTC resolution ▪ Bang-Bang DPLLs assisted by DTC allow same phase-noise performance and fractionalspur level as standard DPLLs at much lower power ...
openaire +1 more source