Results 181 to 185 of about 941 (185)
Some of the next articles are maybe not open access.

The effect of cosmic rays on the soft error rate of a DRAM at ground level

IEEE Transactions on Electron Devices, 1994
exaly  

A DRAM Chip Protection Method Against EMFI Based on PHOTON Hash

2024 IEEE International Test Conference in Asia (ITC-Asia)
Longtao Guo, Qiang Liu 0011
openaire   +1 more source

In-DRAM True Random Number Generation Using Simultaneous Multiple-Row Activation: An Experimental Study of Real DRAM Chips

Ismail Emir Yuksel   +2 more
exaly  

A reliability study of DRAM capacitors in chip for beyond 10 nm scaling

Microelectronics Journal
Juyeon Shin   +5 more
openaire   +1 more source

Product level verification of gate oxide reliability projections using DRAM chips

R -P Vollertsen, E Y Wu
exaly  
fos: computer and information sciences
hardware architecture cs.ar
dram
cryptography and security cs.cr
computer science - hardware architecture
7. clean energy
computer science - cryptography and security
security
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