Results 11 to 20 of about 1,081,243 (285)

Universal trench edge termination design [PDF]

open access: yes2012 24th International Symposium on Power Semiconductor Devices and ICs, 2012
The minimum trench edge termination length for various trench depth is theoretically determined to obtain universal curve for efficient design under considering trade-off relation with trench fabrication difficulty, cost and limitation specially for thin wafer IGBTs and diodes.
Kota Seto   +3 more
core   +4 more sources

A contact detection algorithm for polyhedrons based on improved common-plane concept [PDF]

open access: yesScientific Reports
To address the inaccuracies in contact point calculation and low computational efficiency of traditional common-plane methods in complex contact scenarios, this study proposes an improved contact detection algorithm based on the common-plane concept.
Mingqing Liu
doaj   +2 more sources

Proving termination using abstract interpretation [PDF]

open access: yes, 2010
PhDOne way to develop more robust software is to use formal program verification. Formal program verification requires the construction of a formal mathematical proof of the programs correctness. In the past ten years or so there has been much progress
Chawdhary, Aziem A.
core   +4 more sources

Edge termination design for 1.7 kV silicon carbide p-i-n diodes [PDF]

open access: yesBulletin of the Polish Academy of Sciences: Technical Sciences, 2020
In this work, in order to obtain breakdown voltage values of the 4H-SiC p-i-n diodes above 1.7kV, three designs have been examined: single-zone junction termination extention (JTE), double-zone JTE and a structure with concentric rings outside each of ...
A. Taube, M. Sochacki
doaj   +1 more source

6 kV/180 °C High Temperature Reverse Bias Test Equipment for High Voltage and High Power Devices

open access: yesZhongguo dianli, 2021
High Temperature Reverse Bias (HTRB) test is an important part in reliability tests on IGBTs. The accuracy and function of the test equipment determine the accuracy of the performance monitoring of the tested device.
Erping DENG   +4 more
doaj   +1 more source

Experimentally Engineering the Edge Termination of Graphene Nanoribbons [PDF]

open access: yesACS Nano, 2012
The edges of graphene nanoribbons (GNRs) have attracted much interest due to their potentially strong influence on GNR electronic and magnetic properties. Here we report the ability to engineer the microscopic edge termination of high quality GNRs via hydrogen plasma etching.
Zhang, Xiaowei   +11 more
openaire   +4 more sources

Design and Optimization of Vertical GaN PiN Diodes With Fluorine-Implanted Termination

open access: yesIEEE Journal of the Electron Devices Society, 2020
Gallium nitride (GaN)-based power devices enable high power density and high switching frequency for power electronics systems. For the emerging vertical GaN devices, the electric field crowding around the edge of the main junction could result in ...
Yuxin Liu, Shu Yang, Kuang Sheng
doaj   +1 more source

Vertical GaN-on-GaN Schottky Barrier Diodes With Multi-Floating Metal Rings

open access: yesIEEE Journal of the Electron Devices Society, 2020
Vertical GaN Schottky barrier diodes (SBDs) with floating metal rings (FMRs) as edge termination structures have been fabricated on bulk GaN substrates.
Tsung-Han Yang   +10 more
doaj   +1 more source

Edge states in rationally terminated honeycomb structures

open access: yesProceedings of the National Academy of Sciences, 2022
Consider the tight binding model of graphene, sharply terminated along an edge l parallel to a direction of translational symmetry of the underlying period lattice. We classify such edges l into those of “zigzag type” and those of “armchair type,” generalizing the classical zigzag and armchair edges.
Fefferman, Charles   +2 more
openaire   +4 more sources

Study of a SiC Trench MOSFET Edge-Termination Structure with a Bottom Protection Well for a High Breakdown Voltage

open access: yesApplied Sciences, 2020
A novel edge-termination structure for a SiC trench metal−oxide semiconductor field-effect transistor (MOSFET) power device is proposed. The key feature of the proposed structure is a periodically formed SiC trench with a bottom protection well ...
Jee-Hun Jeong   +4 more
doaj   +1 more source

Home - About - Disclaimer - Privacy