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Spin hall effect of light ellipsometry for nanoscale areal surface measurement [PDF]
Scientific ReportsThis paper presents a novel method for the measurement of nanometer-scale surfaces. The proposed technique takes advantage of the spin hall effect of light (SHEL), which occurs as a sub-wavelength beam shift due to the spin-orbit interaction of light ...
Naila Zahra +3 more
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The influence of shot noise on the performance of phase singularity-based refractometric sensors [PDF]
NanophotonicsTopological singularities of optical response functions – such as reflection amplitudes – enable elegant practical applications ranging from analog signal processing to novel molecular sensing approaches.
Maslova Valeria +5 more
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A virtual microscope for simulation of Nanostructures [PDF]
EPJ Web of Conferences, 2022 Light-matter interplay is widely used for analyzing the topology of surfaces on small scales for use in areas such as nanotechnology, nanoelectronics, photonics, and advanced materials.
Hansen Poul-Erik, Siaudinyte Lauryna
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Systematic and random errors in rotating-analyzer, ellipsometry [PDF]
, 1988 Errors and error sources occurring in rotating-analyzer ellipsometry are discussed. From general considerations it is shown that a rotating-analyzer ellipsometer is inaccurate if applied at P = 0° and in cases when π = 0° or where Δ is near 0° or 180 ...
Nijs, J.M.M. de, Silfhout, A. van
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Spectroscopic ellipsometry for low-dimensional materials and heterostructures
Nanophotonics, 2022 Discovery of low-dimensional materials has been of great interest in physics and material science. Optical permittivity is an optical fingerprint of material electronic structures, and thus it is an important parameter in the study of the properties of ...
Yoo SeokJae, Park Q-Han
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An introduction to terahertz time-domain spectroscopic ellipsometry
APL Photonics, 2022 In the past, terahertz spectroscopy has mainly been performed based on terahertz time-domain spectroscopy systems in a transmission or a window/prism-supported reflection configuration.
X. Chen, E. Pickwell-MacPherson
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Mueller Matrix Ellipsometric Approach on the Imaging of Sub-Wavelength Nanostructures
Frontiers in Physics, 2022 Conventional spectroscopic ellipsometry is a powerful tool in optical metrology. However, when it comes to the characterization of non-periodic nanostructures or structured fields that are much smaller than the illumination spot size, it is not well ...
Tim Käseberg +10 more
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Data in Brief, 2022 Hexagonal, carbon-based structures were prepared on bare and treated copper foil substrates by Chemical Vapor Deposition at 1075 ᵒC using a graphite box for limiting copper reactivity with hydrocarbon gases during growth reactions.
Fahd Rajab
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Optical characterization of aminosilane-modified silicon dioxide surface for biosensing [PDF]
Journal of the European Optical Society-Rapid Publications, 2013 Silicon dioxide surfaces, functionalized by two aminosilane compounds (3-amino-propyl-triethoxysilane, APTES; 3-amino-propyl-dimethyl-ethoxysilane, APDMES) both dissolved in different solvents (dry ethanol and toluene), have been investigated by standard
Terracciano M. +3 more
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Variable Angle Spectroscopic Ellipsometry Characterization of Graphene Oxide in Methanol Films
Crystals, 2022 It has been widely established that solvents modify the functional groups on the graphene oxide (GO) basal plane and, thus, modify its reactivity. Despite the increasing interest in GO films, a less studied aspect is the influence of methanol on the ...
Grazia Giuseppina Politano +1 more
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