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Spin hall effect of light ellipsometry for nanoscale areal surface measurement [PDF]

open access: yesScientific Reports
This paper presents a novel method for the measurement of nanometer-scale surfaces. The proposed technique takes advantage of the spin hall effect of light (SHEL), which occurs as a sub-wavelength beam shift due to the spin-orbit interaction of light ...
Naila Zahra   +3 more
doaj   +2 more sources

The influence of shot noise on the performance of phase singularity-based refractometric sensors [PDF]

open access: yesNanophotonics
Topological singularities of optical response functions – such as reflection amplitudes – enable elegant practical applications ranging from analog signal processing to novel molecular sensing approaches.
Maslova Valeria   +5 more
doaj   +2 more sources

A virtual microscope for simulation of Nanostructures [PDF]

open access: yesEPJ Web of Conferences, 2022
Light-matter interplay is widely used for analyzing the topology of surfaces on small scales for use in areas such as nanotechnology, nanoelectronics, photonics, and advanced materials.
Hansen Poul-Erik, Siaudinyte Lauryna
doaj   +1 more source

Spectroscopic ellipsometry for low-dimensional materials and heterostructures

open access: yesNanophotonics, 2022
Discovery of low-dimensional materials has been of great interest in physics and material science. Optical permittivity is an optical fingerprint of material electronic structures, and thus it is an important parameter in the study of the properties of ...
Yoo SeokJae, Park Q-Han
doaj   +1 more source

An introduction to terahertz time-domain spectroscopic ellipsometry

open access: yesAPL Photonics, 2022
In the past, terahertz spectroscopy has mainly been performed based on terahertz time-domain spectroscopy systems in a transmission or a window/prism-supported reflection configuration.
X. Chen, E. Pickwell-MacPherson
doaj   +1 more source

Mueller Matrix Ellipsometric Approach on the Imaging of Sub-Wavelength Nanostructures

open access: yesFrontiers in Physics, 2022
Conventional spectroscopic ellipsometry is a powerful tool in optical metrology. However, when it comes to the characterization of non-periodic nanostructures or structured fields that are much smaller than the illumination spot size, it is not well ...
Tim Käseberg   +10 more
doaj   +1 more source

Surface and Subsurface Quality Assessment of Polished Lu2O3 Single Crystal Using Quasi-Brewster Angle Technique

open access: yesFrontiers in Physics, 2021
The sesquioxide Lu2O3 single crystal has attracted tremendous attention as potential host material for high-power solid-state lasers. As polishing is the terminal process of conventional ultra-precision machining, the quality of polished crystal directly
Chengyuan Yao   +4 more
doaj   +1 more source

Systematic and random errors in rotating-analyzer, ellipsometry [PDF]

open access: yes, 1988
Errors and error sources occurring in rotating-analyzer ellipsometry are discussed. From general considerations it is shown that a rotating-analyzer ellipsometer is inaccurate if applied at P = 0° and in cases when π = 0° or where Δ is near 0° or 180 ...
Nijs, J.M.M. de, Silfhout, A. van
core   +10 more sources

Ellipsometry, transmission, and photoluminescence characterization of Mn-doped ITO thin films deposited by DC magnetron sputtering

open access: yesMaterials Research Express, 2023
Manganese-doped indium tin oxide (ITO) thin films (0–12.8 at% Mn) were deposited by DC magnetron sputtering. The structural, electrical, and optical properties of the films were studied.
Masoud Kaveh   +5 more
doaj   +1 more source

Data Acquisition of TiO2 for Optical Material by using Spectroscopic Ellipsometry Technique [PDF]

open access: yesEngineering and Technology Journal, 2010
An Ellipsometric experimental set up of SOPRA ES4G type with a powerfulWVASE software for the theoretical calculus of the Ellipsometry parameters. TheEllipsometry Technique can determine amplitude and phase information Ψ( and Δ)dependent on wavelength ...
Asad Sabih Mohammad Raouf
doaj   +1 more source

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