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Spin hall effect of light ellipsometry for nanoscale areal surface measurement [PDF]
This paper presents a novel method for the measurement of nanometer-scale surfaces. The proposed technique takes advantage of the spin hall effect of light (SHEL), which occurs as a sub-wavelength beam shift due to the spin-orbit interaction of light ...
Naila Zahra +3 more
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The influence of shot noise on the performance of phase singularity-based refractometric sensors [PDF]
Topological singularities of optical response functions – such as reflection amplitudes – enable elegant practical applications ranging from analog signal processing to novel molecular sensing approaches.
Maslova Valeria +5 more
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A virtual microscope for simulation of Nanostructures [PDF]
Light-matter interplay is widely used for analyzing the topology of surfaces on small scales for use in areas such as nanotechnology, nanoelectronics, photonics, and advanced materials.
Hansen Poul-Erik, Siaudinyte Lauryna
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Spectroscopic ellipsometry for low-dimensional materials and heterostructures
Discovery of low-dimensional materials has been of great interest in physics and material science. Optical permittivity is an optical fingerprint of material electronic structures, and thus it is an important parameter in the study of the properties of ...
Yoo SeokJae, Park Q-Han
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An introduction to terahertz time-domain spectroscopic ellipsometry
In the past, terahertz spectroscopy has mainly been performed based on terahertz time-domain spectroscopy systems in a transmission or a window/prism-supported reflection configuration.
X. Chen, E. Pickwell-MacPherson
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Mueller Matrix Ellipsometric Approach on the Imaging of Sub-Wavelength Nanostructures
Conventional spectroscopic ellipsometry is a powerful tool in optical metrology. However, when it comes to the characterization of non-periodic nanostructures or structured fields that are much smaller than the illumination spot size, it is not well ...
Tim Käseberg +10 more
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The sesquioxide Lu2O3 single crystal has attracted tremendous attention as potential host material for high-power solid-state lasers. As polishing is the terminal process of conventional ultra-precision machining, the quality of polished crystal directly
Chengyuan Yao +4 more
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Systematic and random errors in rotating-analyzer, ellipsometry [PDF]
Errors and error sources occurring in rotating-analyzer ellipsometry are discussed. From general considerations it is shown that a rotating-analyzer ellipsometer is inaccurate if applied at P = 0° and in cases when π = 0° or where Δ is near 0° or 180 ...
Nijs, J.M.M. de, Silfhout, A. van
core +10 more sources
Manganese-doped indium tin oxide (ITO) thin films (0–12.8 at% Mn) were deposited by DC magnetron sputtering. The structural, electrical, and optical properties of the films were studied.
Masoud Kaveh +5 more
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Data Acquisition of TiO2 for Optical Material by using Spectroscopic Ellipsometry Technique [PDF]
An Ellipsometric experimental set up of SOPRA ES4G type with a powerfulWVASE software for the theoretical calculus of the Ellipsometry parameters. TheEllipsometry Technique can determine amplitude and phase information Ψ( and Δ)dependent on wavelength ...
Asad Sabih Mohammad Raouf
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