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An introduction to terahertz time-domain spectroscopic ellipsometry [PDF]

open access: goldAPL Photonics, 2022
In the past, terahertz spectroscopy has mainly been performed based on terahertz time-domain spectroscopy systems in a transmission or a window/prism-supported reflection configuration.
X. Chen, E. Pickwell-MacPherson
doaj   +3 more sources

Spectroscopic ellipsometry for low-dimensional materials and heterostructures

open access: yesNanophotonics, 2022
Discovery of low-dimensional materials has been of great interest in physics and material science. Optical permittivity is an optical fingerprint of material electronic structures, and thus it is an important parameter in the study of the properties of ...
Yoo SeokJae, Park Q-Han
doaj   +2 more sources

Metasurface array for single-shot spectroscopic ellipsometry [PDF]

open access: goldLight: Science & Applications, 2023
Spectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. Most conventional ellipsometers utilize mechanically rotating polarizers and grating-based spectrometers for ...
Shun Wen   +5 more
semanticscholar   +3 more sources

Spin hall effect of light ellipsometry for nanoscale areal surface measurement [PDF]

open access: yesScientific Reports
This paper presents a novel method for the measurement of nanometer-scale surfaces. The proposed technique takes advantage of the spin hall effect of light (SHEL), which occurs as a sub-wavelength beam shift due to the spin-orbit interaction of light ...
Naila Zahra   +3 more
doaj   +2 more sources

Dual-comb spectroscopic ellipsometry [PDF]

open access: yesNature Communications, 2017
Spectroscopic ellipsometry is an established technique to characterize the optical properties of a material. Here, Minamikawa et al. combine the method with dual-comb spectroscopy, which allows them to obtain ellipsometric parameters including the phase ...
Takeo Minamikawa   +10 more
doaj   +2 more sources

Temperature dependent optical constants for SiO2 film on Si substrate by ellipsometry

open access: yesMaterials Research Express, 2017
In situ ellipsometry measurements in the spectra range from 246 to 1000 nm were performed on a SiO _2 /Si system at temperatures varying from 25 to 600 °C.
Junbo Gong   +5 more
doaj   +2 more sources

The influence of shot noise on the performance of phase singularity-based refractometric sensors [PDF]

open access: yesNanophotonics
Topological singularities of optical response functions – such as reflection amplitudes – enable elegant practical applications ranging from analog signal processing to novel molecular sensing approaches.
Maslova Valeria   +5 more
doaj   +2 more sources

Optical Constants of Several Multilayer Transition Metal Dichalcogenides Measured by Spectroscopic Ellipsometry in the 300–1700 nm Range: High Index, Anisotropy, and Hyperbolicity [PDF]

open access: yesACS Photonics, 2022
Transition metal dichalcogenides (TMDs) attract significant attention due to their remarkable optical and excitonic properties. It was understood already in the 1960s and recently rediscovered that many TMDs possess a high refractive index and optical ...
B. Munkhbat   +3 more
semanticscholar   +1 more source

A virtual microscope for simulation of Nanostructures [PDF]

open access: yesEPJ Web of Conferences, 2022
Light-matter interplay is widely used for analyzing the topology of surfaces on small scales for use in areas such as nanotechnology, nanoelectronics, photonics, and advanced materials.
Hansen Poul-Erik, Siaudinyte Lauryna
doaj   +1 more source

Sparse ellipsometry [PDF]

open access: yesACM Transactions on Graphics, 2022
Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully calibrated in lab
Inseung Hwang   +5 more
semanticscholar   +1 more source

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