Results 141 to 150 of about 55,978 (270)

Infrared ellipsometry study of the charge dynamics in K3p-terphenyl

, 2023
Qi He, P. Maršík, F. Le Mardelé, Bîng Xu, M. Sharma, N. Pinto, Andrea Perali, Corrado Di Nicola, Claudio Pettinari, D. Baeriswyl, D. Baeriswyl   +10 more
openalex   +1 more source

Stability of Organic Photovoltaics: From Root Causes to Advanced Analytical Techniques

Advanced Energy Materials, EarlyView.
This review explains the causes and mechanisms of degradation in organic photovoltaics (OPVs). It explores how various factors, including heat, light, oxygen, and inherent material properties, influence OPV stability. The study categorizes degradation pathways and analyzes their impact on device performance, providing insights into the fundamental ...
Yelim Choi, Dohyun Kim, Seung Un Ryu, Hangyeol Kim, Sungryong Kim, Minjun Kim, Taiho Park   +6 more
wiley   +1 more source

Structure and Spectroscopic Characterisation of Phenanthroline‐Based Iodobismuthate(III) Complexes Utilised for Raw Acoustic Signal Classification

Advanced Intelligent Discovery, EarlyView.
Memristors based on trimethylsulfonium (phenanthroline)tetraiodobismuthate have been utilised as a nonlinear node in a delayed feedback reservoir. This system allowed an efficient classification of acoustic signals, namely differentiation of vocalisation of the brushtail possum (Trichosurus vulpecula).
Ewelina Cechosz, Gisya Abdi, Andrzej Sławek, Marlena Gryl, Konrad Szaciłowski   +4 more
wiley   +1 more source

Machine Learning Based on Digital Image Colorimetry Driven In Situ, Noncontact Plasma Etch Depth Prediction

Advanced Intelligent Systems, EarlyView.
A real‐time and noncontact approach predicts etch depth in plasma etching using digital image colorimetry and machine learning. Red, green, and blue features from in situ images enable accurate predictions without relying on process parameters. Optical emission spectroscopy provides process diagnostics, ensuring stable operating conditions. This method
Minji Kang, Seongho Kim, Eunseo Go, Donghyeon Paek, Geon Lim, Muyoung Kim, Changmin Kim, Soyeun Kim, Sung Kyu Jang, Moon Soo Bak, Min Sup Choi, Woo Seok Kang, Jaehyun Kim, Jaekwang Kim, Hyeong‐U Kim   +14 more
wiley   +1 more source

ELLIPSOMETRY APPLIED TO THE STUDY OF SEMICONDUCTOR SURFACES

, 1977
H. Lüth
openalex   +2 more sources

Rare Mononuclear Lithium–Carbene Complex for Atomic Layer Deposition of Lithium Containing Thin Films

Angewandte Chemie International Edition, EarlyView.
A new N‐heterocyclic carbene (NHC) stabilized lithium complex is introduced as a thermally stable atomic layer deposition (ALD) precursor. It features a rare mononuclear structure, suitable volatility, and a low melting point of 55 °C. ALD trials yielded lithium silicate films.
Jorit Obenlüneschloß, Nils Boysen, Karl Rönnby, Arbresha Muriqi, Volker Hoffmann, Carlos Abad, Detlef Rogalla, Ulrike Brokmann, Edda Rädlein, Michael Nolan, Anjana Devi   +10 more
wiley   +1 more source

Pulsed-Source MOCVD of High-k Dielectric Thin Films with in situ Monitoring by Spectroscopic Ellipsometry

, 2003
Endoh, M, Hattori, T, Kurosawa, M, Oda, S, Tsuchiya, Yoshishige, Tung, R. T   +5 more
core   +1 more source

Investigation of micro-arc oxidation coatings using sub-THz ellipsometry

, 2022
A. A. Galuza, Ivan Kolenov, D.V. Vinnikov, Sergey Mizrakhy, A. A. Savchenko   +4 more
openalex   +1 more source

Solution ALD of (CH3NH3)(PbI3) Perovskite Thin Films Yields Functional Quality and Stability Superior to Classical Processing

Angewandte Chemie International Edition, EarlyView.
Chemically controlled deposition of the prototypical hybrid halide perovskite methylammonium triiodoplumbate(II), MAPI, is demonstrated in layer by layer fashion from the solution phase. Theoretical modeling confirms the accretion mechanism. Extensive materials and functional characterization highlight how chemical control of nucleation and growth ...
Vanessa M. Koch, Xinyi Zeng, Andreas S. Deckert, Pascal Büttner, Evanie Franz, Fei Ding, Michael A. Anderson, Jiyun Zhang, Christian Kupfer, Elena A. Mack, Vipul K. Ambasta, Patrick Duchstein, Katharina E. Dehm, Stevie Furxhiu, Achim Zahl, Johannes Frisch, Felix Hoga, Tobias Stubhan, Regan G. Wilks, Zijian Peng, Olaf Brummel, Ryan W. Crisp, Dirk Zahn, Carolin Müller, Dirk M. Guldi, Marcus Bär, Dorothea Wisser, Jörg Libuda, Christoph J. Brabec, Julien Bachmann   +29 more
wiley   +1 more source

Optical, Structural, and Charge Transport Properties of Individual Ti₃C₂T_<i>x</i> MXene Flakes via Micro-Ellipsometry and Beyond. [PDF]

ACS Nano
Kenaz R, Ghosh S, Lounasvuori M, Sharma N, Remennik S, Vakahi A, Steinberg H, Petit T, Rapaport R, Furchner A.   +9 more
europepmc   +1 more source