Results 171 to 180 of about 57,474 (219)

Adsorption-Induced Optical Modulation in ZIF Thin Film Stacks with Distinct Order for Photonic Crystal Applications. [PDF]

ACS Appl Mater Interfaces
Keppler NC, Steinbach L, Fricke J, Hannebauer A, Rohloff E, Schaate A, Behrens P.   +6 more
europepmc   +1 more source

Breaking refractive index records with layered van der Waals GeS₂ for blue and near-ultraviolet photonics. [PDF]

Light Sci Appl
Shafirin P, Hossain M, Davoyan A.
europepmc   +1 more source

Spectroscopic ellipsometry

Materials Today, 2005
openaire   +1 more source

Plasmon-exciton polaritonic emission lifetime dynamics under strong coupling. [PDF]

Nanophotonics
Jurkšaitis P, Anulytė J, Spalinskaitė E, Bužavaitė-Vertelienė E, Žičkus V, Banevičius D, Kazlauskas K, Balevičius Z.   +7 more
europepmc   +1 more source

Bandgap of Epitaxial Single-Crystal BiFe_1-xMn_xO₃ Films Grown Directly on SrTiO₃/Si(001). [PDF]

Materials (Basel)
Cantrell SR, Miracle JT, Cottier RJ, Lindsey S, Theodoropoulou N.   +4 more
europepmc   +1 more source

Glycosaminoglycan-Inspired Polymer Brushes Promote Human Mesenchymal Stem Cell Proliferation While Retaining Trilineage Differentiation Potential. [PDF]

ACS Appl Mater Interfaces
Nelson CL, Castellion CA, Humpal AP, Sekar RP, Chaudhary N, Villa-Diaz LG, Kumar R.   +6 more
europepmc   +1 more source

Investigations on Thermal Transitions in PDPP4T/PCPDTBT/AuNPs Composite Films Using Variable Temperature Ellipsometry

Barbara Hajduk, Paweł Jarka, Pallavi Kumari, Henryk Janeczek, Marcin Godzierz, Yao Mawuena Tsekpo, Tomasz Tański   +6 more
openalex   +2 more sources

Characterization of the 3D-Optical Properties of van der Waals Materials with Deep Learning-Based Coherent Fourier Scatterometry. [PDF]

ACS Photonics
Paul A, Rishav K, Klootwijk G, Sarkar M, Bisht O, Li Z, Conesa-Boj S, Papadakis GT, Pereira SF.   +8 more
europepmc   +1 more source

Nanoscale monitoring of the initial stage of water condensation on a printed circuit board. [PDF]

Heliyon
Romanenko A, Gharaibeh A, Medgyes B, Petrik P.   +3 more
europepmc   +1 more source

Non-Destructive Ellipsometric Analysis of the Refractive Index of Historical Enamels. [PDF]

Materials (Basel)
Palomar T, Pradell T, Mosa J.
europepmc   +1 more source