Results 201 to 210 of about 82,139 (350)
Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology. [PDF]
Oh J +14 more
europepmc +1 more source
Brilliant mid-infrared ellipsometry and polarimetry of thin films: Toward laboratory applications with laser based techniques [PDF]
Karsten Hinrichs +3 more
openalex +1 more source
A robust heparin‐mimicking coating based on sulfated polyglycerol is constructed via layer‐by‐layer assembly on bloodcontacting surfaces. The coating exhibits long‐term anticoagulant and anti‐inflammatory properties by resisting protein adsorption, preventing platelet activation, and suppressing immune responses, offering a promising strategy for ...
Kunpeng Liu +3 more
wiley +1 more source
High-quality polycrystalline vanadium dioxide thin films deposited via pulsed laser deposition with high uniformity and consistency. [PDF]
Huang Z +6 more
europepmc +1 more source
A new, solution‐processable class of optical materials based on molecular hybrids of metal oxide hydrates and commodity polymers is discussed here, including their synthesis, processing into thin films, patterning, and photonic structures realized to date.
Victoria Quirós‐Cordero +9 more
wiley +1 more source
Spectroscopic ellipsometry mapping of PAAO (AJ-3-04-20 sample)
Aušrinė Jurkevičiūtė
openalex +2 more sources
Colossal Cryogenic Electro‐Optic Response Through Metastability in Strained BaTiO3 Thin Films
Utilizing the thermodynamic theory of optical properties, a colossal cryogenic electro‐optic response in BaTiO3 thin films is designed and demonstrated by stabilizing a low symmetry metastable monoclinic phase via epitaxial strain tuning with an electro‐optic response reaching ≈2516 pm V−1 at 5 K. This approach represents a new paradigm for engineering
Albert Suceava +16 more
wiley +1 more source
By tracking bulk carrier diffusion both vertically and laterally, this study links photoluminescence behavior to crystal quality in CsPbBr3 γ‐ray detectors. Vertical diffusion governs spectral redshift, with high‐quality crystals exhibiting superior transport, while two‐photon microscopy reveals microscale defects that hinder diffusion in low‐quality ...
Zimu Wei +7 more
wiley +1 more source
Structural, optical and electrical properties of Si-rich and N-rich PECVD silicon nitride films. [PDF]
Moussi TA +7 more
europepmc +1 more source

