Results 81 to 90 of about 31,024 (191)

Preliminary work item (PWI) 23131 on standardization of ellipsometry

, 2018
The paper addresses the PRELIMINARY WORK ITEM (PWI) 23131 ON STANDARDIZATION OF ELLIPSOMETRY and the following points are discussed in more detail: Historical background of ellipsometry, Technical/industrial importance of ellipsometry and Standardization
Beck, Uwe
core  

Artificial Intelligence for Fluorite Ferroelectric Materials: From Discovery to Optimization

Advanced Electronic Materials, EarlyView.
Artificial intelligence accelerates the discovery and optimization of HfO2‐based fluorite ferroelectrics by linking synthesis, structure, properties, and device performance. Machine learning, deep‐learning analysis, and AI‐driven atomistic modeling enable predictive design, dopant screening, and closed‐loop optimization toward next‐generation ...
Faizan Ali, David Lehninger, Florencio Sánchez, Ignasi Fina   +3 more
wiley   +1 more source

Reveal Non‐Uniform Passivation on Lithium Metal Anode With Operando Spectroscopic Ellipsometry

Advanced Energy Materials, EarlyView.
In‐operando spectroscopic ellipsometry reveals how nucleation and crystallographic orientation govern the non‐uniform growth of native passivation films on lithium metal. Time‐resolved thickness mapping captures island formation and coalescence, while orientation‐dependent measurements show that the equilibrium film on Li(110) is approximately half as ...
Jianyu Li, Hanrui Zhang, Dongliang Chen, Feifei Shi   +3 more
wiley   +1 more source

Optimized Choice of Light Incidence Angles for the Determination of Optical Constants from Strongly Absorbing Thin Solid Films in a Narrow Spectral Range

Solids
The determination of the linear optical constants of solids is an important part of solid state optical characterization. Reflection spectroscopy and ellipsometry of surfaces or thin solid films represent established techniques to access those optical ...
Steffen Wilbrandt, Olaf Stenzel
doaj   +1 more source

Generative and Experimental Validation of High Refractive Index Polymers via Domain Knowledge Approach with Small Data

Advanced Intelligent Discovery, EarlyView.
This research demonstrates that the combination of domain knowledge–based multiple regression, multi‐objective Bayesian optimization, and generative models is a suitable prediction tool for candidates of high refractive index polymers, even with the constraints in the model trained on limited data. The experimental validation can reproduce the proposed
Takuya Yokoo, Seigo Watanabe, Hana Matsunaga, Kenichi Oyaizu   +3 more
wiley   +1 more source

Artificial Intelligence in Ellipsometry: Methods, Challenges, and Opportunities

Crystals
Spectroscopic ellipsometry (SE) is a non-destructive optical technique widely used to extract film thickness, optical constants, surface roughness, and compositional information.
Grazia Giuseppina Politano
doaj   +1 more source

SECTIONING METHOD APPLICATION AT ELLIPSOMETRY OF INHOMOGENEOUS REFLECTION SYSTEMS [PDF]

Научно-технический вестник информационных технологий, механики и оптики, 2014
The paper deals with investigation of application peculiarities of ellipsometry methods and UF spectrophotometry at mechanical and chemical processing of optical engineering surface elements made of quartz glass.
A. N. Gorlyak, V. M. Solonukha, I. A. Khramtsovsky   +2 more
doaj  

Covalent Immobilisation of PVA‐MA Hydrogels on Plasma‐Activated Coatings: Achieving Superior Adhesion by Reagent‐Free Formation of a Nanoscale Primer Layer

Advanced NanoBiomed Research, EarlyView.
Robust attachment of hydrogels to solid substrates is critical to success in cell culture where hydrostatic and contractile forces can contribute to delamination of weakly adhered gels. This novel approach forms a nanometer‐scale, reagent‐free hydrogel primer layer to provide improved resistance to delamination of subsequent bulk hydrogel layers in a ...
Sophia C. Franklin, Clara T. H. Tran, Matthew Hadden, David Martinez‐Martin, Laura Poole‐Warren, Marcela M. M. Bilek, Ulises Aregueta Robles, Aaron D. Gilmour   +7 more
wiley   +1 more source

Revisiting Dopant Deactivation In Silicon Nanostructures

Advanced Physics Research, EarlyView.
Dopant activation is essential for the operation of semiconductor devices. On the nanoscale, however, quantum confinement and dielectric mismatch impede dopant activation. Here, we study the ionization of phosphorous in ultrathin silicon films embedded in different dielectric environments.
J. Knoch, D. König, M. Frentzen, Y.‐C. Chang, D. Hiller   +4 more
wiley   +1 more source

Transient dielectric function dynamics driven by coherent phonons in Bismuth crystal

Journal of the European Optical Society-Rapid Publications
In this study, we investigate the ultrafast transient dynamics of the dielectric function in bismuth crystal, excited by femtosecond laser pulses and modulated by coherent phonons. The primary aim is to understand the influence of the coherent A1g phonon
Boschetto Davide, Morineau Denis
doaj   +1 more source