Results 1 to 10 of about 381 (171)
Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection [PDF]
IEEE Access, 2019 Reliable computer systems employ error control codes (ECCs) to protect information from errors. For example, memories are frequently protected using single error correction-double error detection (SEC-DED) codes.
Luis-J. Saiz-Adalid +4 more
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Spectrum Shaping Error Correction Codes for High-Density Data Storage Systems [PDF]
IEEE AccessThe study provides a novel and systematic method for designing high-efficiency spectral shaping error-correction codes (ECCs) for high-density data storage systems.
Chi Dinh Nguyen
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Channel Modeling and Quantization Design for 3D NAND Flash Memory [PDF]
Entropy, 2023 As the technology scales down, two-dimensional (2D) NAND flash memory has reached its bottleneck. Three-dimensional (3D) NAND flash memory was proposed to further increase the storage capacity by vertically stacking multiple layers.
Cheng Wang +5 more
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Improving MRAM Performance with Sparse Modulation and Hamming Error Correction [PDF]
SensorsWith the rise of the Internet of Things (IoT), smart sensors are increasingly being deployed as compact edge processing units, necessitating continuously writable memory with low power consumption and fast access times.
Nam Le +3 more
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Joint Optimization of Codeword Bit Distribution and Detection Threshold for Asymmetric STT-MRAM Channel [PDF]
SensorsAsymmetric error characteristics in spin-transfer torque magnetic random-access memory (STT-MRAM), particularly the imbalance between logical ‘0’ and ‘1’ error probabilities, can significantly degrade system reliability under conventional modulation and ...
Thien An Nguyen, Jaejin Lee
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Error Correction Codes for Double Burst Errors Correction in Memories
IEEE AccessThis paper addresses the issue of double burst errors occurring in memories and presents the design of corresponding error correction codes (ECC). The proposed ECCs can correct up to two burst errors simultaneously, each up to 4-bit.
He Liu +4 more
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ECC‐BERT: Classification of error correcting codes using the improved bidirectional encoder representation from transformers [PDF]
IET Communications, 2022 Abstract The recent concept of contextual information in error correcting code (ECC) can significantly improve the capacity of the blind recognition of codes with deep learning (DL) approaches. However, the fundamental challenges of existing DL‐based methods are inflexible structure and limited kernel size which bring great ...
Sida Li 0001 +3 more
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IEEE Access, 2023 Spin-torque-transfer magnetic random access memory (STT-MRAM) has recently emerged as a promising technology to replace dynamic random access memory (DRAM).
Thien An Nguyen, Jaejin Lee
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Sensors, 2021 Traditional authentication techniques, such as cryptographic solutions, are vulnerable to various attacks occurring on session keys and data. Physical unclonable functions (PUFs) such as dynamic random access memory (DRAM)-based PUFs are introduced as ...
Fatemeh Najafi +3 more
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Compression-Assisted Adaptive ECC and RAID Scattering for NAND Flash Storage Devices
Sensors, 2020 NAND flash memory-based storage devices are vulnerable to errors induced by NAND flash memory cells. Error-correction codes (ECCs) are integrated into the flash memory controller to correct errors in flash memory. However, since ECCs show inherent limits
Seung-Ho Lim, Ki-Woong Park
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