Results 11 to 20 of about 32,656 (190)

Liquid Phase TEM of Diffusing Emulsion Droplets. [PDF]

Small
Motion of emulsion droplets was observed via in situ liquid phase transmission electron microscopy. Analysis revealed that the motion is self‐affine and influenced by multiple stochastic processes, as well as a fractal landscape created by the electron beam.
Vratsanos MA, Bakalis E, Park C, Zerbetto F, Gianneschi NC.   +4 more
europepmc   +2 more sources

Sparse Code With Minimum Hamming Distance of Three for Spin-Torque Transfer Magnetic Random Access Memory

IEEE Access, 2023
Spin-torque-transfer magnetic random access memory (STT-MRAM) has recently emerged as a promising technology to replace dynamic random access memory (DRAM).
Thien An Nguyen, Jaejin Lee
doaj   +1 more source

Deep PUF: A Highly Reliable DRAM PUF-Based Authentication for IoT Networks Using Deep Convolutional Neural Networks

Sensors, 2021
Traditional authentication techniques, such as cryptographic solutions, are vulnerable to various attacks occurring on session keys and data. Physical unclonable functions (PUFs) such as dynamic random access memory (DRAM)-based PUFs are introduced as ...
Fatemeh Najafi, Masoud Kaveh, Diego Martín, Mohammad Reza Mosavi   +3 more
doaj   +1 more source

Protecting Memories against Soft Errors: The Case for Customizable Error Correction Codes

IEEE Transactions on Emerging Topics in Computing, 2021
As technology scales, radiation induced soft errors create more complex error patterns in memories with a single particle corrupting several bits. This poses a challenge to the Error Correction Codes (ECCs) traditionally used to protect memories that can
Jiaqiang Li, P. Reviriego, Liyi Xiao, Haotian Wu   +3 more
semanticscholar   +1 more source

Fault Injection Emulation for Systems in FPGAs: Tools, Techniques and Methodology, a Tutorial

Sensors, 2021
Communication systems that work in jeopardized environments such as space are affected by soft errors that can cause malfunctions in the behavior of the circuits such as, for example, single event upsets (SEUs) or multiple bit upsets (MBUs).
Óscar Ruano, Francisco García-Herrero, Luis Alberto Aranda, Alfonso Sánchez-Macián, Laura Rodriguez, Juan Antonio Maestro   +5 more
doaj   +1 more source

Compression-Assisted Adaptive ECC and RAID Scattering for NAND Flash Storage Devices

Sensors, 2020
NAND flash memory-based storage devices are vulnerable to errors induced by NAND flash memory cells. Error-correction codes (ECCs) are integrated into the flash memory controller to correct errors in flash memory. However, since ECCs show inherent limits
Seung-Ho Lim, Ki-Woong Park
doaj   +1 more source

Interleaver Design for Small-Coupling-Length Spatially Coupled Protograph LDPC-Coded BICM Systems Over Wireless Fading Channels

IEEE Access, 2020
As a class of convolutional error-correction codes (ECCs), spatially coupled protograph low-density parity-check (SC-PLDPC) codes with a sufficiently large coupling length can approach the channel capacity under belief propagation (BP) decoding. However,
Yunlong Zhao, Yi Fang, Zhaojie Yang
doaj   +1 more source

Laser Induced Single Event Upset (SEU) Testing of Commercial Memory Devices with Embedded Error Correction Codes (ECC)

Journal of Physics: Conference Series, 2022
Abstract Results of laser-induced single event upset testing of devices with embedded error correction codes are described. Specifically, the memory system, consisting of a Micron MT41K256M16TW-107 IT: P 32 Meg×16×8 banks Dual Dynamic Random Access Memories (DDRs) was tested on a self-made test board. Two samples of each memory system or
Yang Han, Yurong Liu, Zhifeng Lei, Zhangang Zhang, Yujuan He   +4 more
openaire   +1 more source

Improving Bit-Error-Rate Performance Using Modulation Coding Techniques for Spin-Torque Transfer Magnetic Random Access Memory

IEEE Access, 2023
In non-volatile random-access memory (RAM) technologies, the spin-torque transfer magnetic random-access memory (STT-MRAM) is a promising candidate. STT-MRAM has attracted attention owing to its advantages, such as a high density, high endurance, and ...
Thien An Nguyen, Jaejin Lee
doaj   +1 more source

How to Mask in Error Correction Code Transformer: Systematic and Double Masking [PDF]

arXiv.org, 2023
In communication and storage systems, error correction codes (ECCs) are pivotal in ensuring data reliability. As deep learning's applicability has broadened across diverse domains, there is a growing research focus on neural network-based decoders that ...
Seong-Joon Park, Heeyoul Kwak, Sang-Hyo Kim, Sunghwan Kim, Yongjune Kim, Jong-Seon No   +5 more
semanticscholar   +1 more source