Results 211 to 220 of about 8,377,275 (246)

Gate‐Induced Critical Current Modulation in W–C Nanowires: The Role of Fabrication

Advanced Materials Technologies, EarlyView.
Focused ion beam induced deposition (FIBID) enables precise control of superconducting W–C nanowire devices. Introducing a Ga+ focused ion beam (FIB) cleaning step reduces substrate damage and suppresses leakage currents, shifting gating thresholds to higher voltages.
Alba Arroyo‐Fructuoso, Gregor Hlawacek, Rosa Córdoba   +2 more
wiley   +1 more source

From Tracks to Hotspots: Particle-Dependent Radiation Energy Deposition in MAPbI₃ Perovskite. [PDF]

Nanomaterials (Basel)
Novoselov IE, Xing Z, Sun H, Zhidkov IS.
europepmc   +1 more source

3D nanoprinting of metals by spatiotemporally confined hot electrons via multiple-electron excitations in nanocrystals. [PDF]

Nat Commun
Wei K, Chang K, Wang X, Lan S, Hipwell MC, Pan H.   +5 more
europepmc   +1 more source

Reactive Oxygen Ion Beam-Induced Deposition for Concurrent Purification of Platinum Nanostructures. [PDF]

Nanomaterials (Basel)
Sprecker K, Ghosh S, Rack PD, Randolph SJ.   +3 more
europepmc   +1 more source

Using X-ray free electron lasers to explore extreme states under quasi-static compression. [PDF]

Nat Commun
Husband RJ, McWilliams RS, Frost M, Konôpková Z.   +3 more
europepmc   +1 more source

Origin of circular and triangular pores in electron-irradiated hexagonal boron nitride. [PDF]

Nat Commun
Javed U, Längle M, Zobač V, Markevich A, Mayer BM, Kofler C, Paul M, Lorber D, Ravindran N, Mangler C, Susi T, Kotakoski J.   +11 more
europepmc   +1 more source

Metasurface-Enabled Helical Wavefront Fingerprint Metrology for Quantitative Retrieval of Liquid Optical Constants. [PDF]

Adv Sci (Weinh)
Zhou Y, Li H, Li S, Jiao F, Du Y, Kim JT, Lee SS, Choi DY, Ding F, Yu X, Guan X.   +10 more
europepmc   +1 more source

Purification of Ru structures created by focused electron beam induced deposition

, 2018
Jurczyk, Jakub, Brewer, Christopher, Hawkins, Olivia, Polyakov, Mikhail, Kapusta, Czesław, McElwee-White, Lisa, Utke, Ivo   +6 more
openaire   +1 more source

Focused electron beam induced deposition as a tool to create electron vortices [PDF]

Micron, 2016
: Focused electron beam induced deposition (FEBID) is a microscopic technique that allows geometrically controlled material deposition with very high spatial resolution.
Robert Winkler, Ferdinand Hofer, Jo Verbeeck   +2 more
exaly   +5 more sources

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Focused, Nanoscale Electron-Beam-Induced Deposition and Etching

Critical Reviews in Solid State and Materials Sciences, 2006
Focused electron-beam-induced (FEB-induced) deposition and etching are versatile, direct-write nanofabrication schemes that allow for selective deposition or removal of a variety of materials. Fundamentally, these processes are governed by an electron-induced reaction with a precursor vapor, which may either result in decomposition to a solid deposit ...
Jason Fowlkes, Philip D Rack, Steven Randolph   +2 more
exaly   +2 more sources