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Corrections to "Low-Forward-Voltage-Drop 4H-SiC BJTs Without Base Contact Implantation"

IEEE Transactions on Electron Devices, 2008
Hyung-Seok Lee   +3 more
openaire   +1 more source

Non-Invasive Junction Temperature Measurement Using Forward Voltage Drop of High-Power pcLED Under Tropical Conditions

2025 8th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)
Arindam Chakraborty   +2 more
openaire   +1 more source

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