Results 91 to 100 of about 18,669 (218)

Vacancy‐Type Defects in n‐Type GaN Fabricated by Low‐Dose Ion Implantation Studied by a Monoenergetic Positron Beam

open access: yesphysica status solidi (b), Volume 263, Issue 3, March 2026.
Vacancies in low‐dose ion‐implanted GaN are studied by positron annihilation. Depth profiles of the net donor concentration (ND) are close to those for implanted impurities, but ND is 2–3 times higher than concentrations of implanted ions. The origin of donor‐like defects is expected to be N‐vacancy‐related defects, and Ga‐vacancy‐type defects play a ...
Akira Uedono   +6 more
wiley   +1 more source

MOCVD-grown, ultra-thin barrier AlN/GaN/AlN HEMTs fabricated using commercial GaN foundry process for Ka-band operation

open access: yesApplied Physics Express
This work presents aluminum nitride (AlN)/gallium nitride (GaN)/AlN high electron mobility transistors (HEMTs) on 100 mm silicon carbide (SiC) fabricated using a commercial 150 nm RF GaN foundry process.
Reet Chaudhuri   +7 more
doaj   +1 more source

Systematic Study of Fermi‐Level Pinning at Crystalline Metal/GaN Interfaces: First‐Principles Calculations and Diode Characterization

open access: yesRare Metals, Volume 45, Issue 3, March 2026.
ABSTRACT The Schottky barrier height (SBH), which serves as a pivotal determinant of charge carrier injection efficiency in electronic devices, critically governs electrical behavior at metal/semiconductor interfaces. However, pronounced metal‐induced gap states at metal contact interfaces induce Fermi‐level pinning, which constrains the ...
Xiaofei Liu   +10 more
wiley   +1 more source

Optimal Selection and Experimental Verification of Wide-Bandgap Semiconductor for Betavoltaic Battery

open access: yesNanomaterials
Wide-bandgap semiconductor betavoltaic batteries have a promising prospect in Micro-Electro-Mechanical Systems for high power density and long working life, but their material selection is still controversial.
Jiachen Zhang   +6 more
doaj   +1 more source

Virtualization as a New Scaling Law for Semiconductor Devices Beyond Geometric Scaling

open access: yesSmall, Volume 22, Issue 17, 20 March 2026.
AI‐enabled semiconductor scaling law. Virtualization emerges as an AI‐enabled scaling law for semiconductors, where progress depends on replacing physical iteration with credible virtual evidence. Surrogate modeling accelerates design‐space exploration, digital twins virtualize process learning, and defect‐to‐reliability inference advances ...
Zeheng Wang   +8 more
wiley   +1 more source

Impact of Defects on the Low-Field Electron Mobility in GaN-on-Si HEMTs

open access: yesIEEE Journal of the Electron Devices Society
In this work, we investigate the field and temperature dependence of the electron mobility in aluminum-gallium-nitride/gallium-nitride (AlGaN/GaN) high electron mobility transistors (HEMTs) realized on GaN-on-silicon (Si) substrates.
Ran Zhou   +2 more
doaj   +1 more source

Self‐Lubricating and Surface‐State‐Modulated p‐p Heterojunction for Robust In Situ Sensing and Deep Learning‐Enabled Condition Identification

open access: yesSmartSys, Volume 2, Issue 1, March 2026.
ABSTRACT The rapid expansion of Internet of things (IoT) and cyber‐physical systems presents a formidable challenge for sustainably powering massive numbers of distributed sensors. Friction, a ubiquitous phenomenon typically viewed as a source of energy dissipation, offers a novel avenue for energy harvesting and in situ sensing.
Song Wang   +6 more
wiley   +1 more source

Deep Etched Gallium Nitride Waveguide for Raman Spectroscopic Applications

open access: yesCrystals, 2019
Gallium nitride (GaN) materials with a high chemical stability and biocompatibility are well suited for bio-sensing applications and evanescent wave spectroscopy.
Yu-Li Hsieh   +8 more
doaj   +1 more source

The Electrical Properties of Al, ga1-Xn Thin Films Deposited on Si(111) Substrate by Chemical Solution Deposition Method [PDF]

open access: yes
AlxGa1-xN thin films with the GaN buffer layer was deposited on Si(111) substrate by chemical solution deposition (CSD) method. The objective of this research was to evaluate the electrical properties of AlxGa1-xN with variation of Al mole fraction ...
Hadiyanto, Hadiyanto   +3 more
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