Results 71 to 80 of about 856 (145)
Structural and optical analysis of GaN and InxGa1-xN photodetectors fabricated by PEALD on silicon
The optical, structural, morphological and chemical properties of Gallium nitride (GaN) and Indium Gallium nitride (InxGa1-xN) thin films grown on Si (100) by plasma-assisted atomic layer deposition (PEALD) technique at a temperature of 300°C.
D. Tepatzi-Xahuentitla +10 more
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Room Temperature Gas Sensor Based on GaN/PANI Micro Composite with Ultrahigh NH3 Gas Sensibility
[Purposes] This study is carriedout to discuss on the response of gallium nitride (GaN) and polyaniline (PANI) composites to ammonia (NH3) at room temperature.
LIU Xiaoru +4 more
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Heavy electron doping in monolayer MoS2 on a freestanding N-face GaN substrate
This study explores how gallium nitride (GaN) surface polarity affects the optical properties and surface potential of MoS _2 . Using Raman spectroscopy, photoluminescence, and Kelvin force microscopy (KFM), significant electron doping (∼10 ^14 cm ^−2 ...
Kaipeng Rong +7 more
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As the demand for high voltage levels and fast charging rates in the electric power industry increases, the third-generation semiconductor materials typified by GaN with a wide bandgap and high electron mobility have become a central material in ...
Yi Peng +9 more
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In this study, the sensitivity and reactivity of the T-graphene (T-G), T-boron nitride (T-BN), T-aluminum nitride (T-AlN), and T-gallium nitride (T-GaN) as carriers for thioguanine (Tg) anticancer drug have been explored using DFT simulations.
Md Najmus Sakib +5 more
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Properties of Erbium and Ytterbium Doped Gallium Nitride Layers Fabricated by Magnetron Sputtering
We report about some properties of erbium and erbium/ytterbium doped gallium nitride (GaN) layers fabricated by magnetron sputtering onsilicon, quartz and Corning glass substrates.
V. Prajzler +7 more
doaj
This work demonstrates, for the first time, the three-dimensional monolithic integration of amorphous indium–gallium–zinc oxide (a-IGZO) thin-film transistors (TFTs) directly on gallium nitride (GaN) high electron mobility transistors (HEMTs) in a ...
Tian-Li Wu +5 more
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X‐band quasi class‐F HPA MMIC using DynaFET GaN HEMT modelling
This paper proposes an X‐band quasi Class‐F high power amplifier (HPA) monolithic microwave integrated circuit (MMIC) using DynaFET gallium nitride (GaN) high electron mobility transistor (HEMT) modelling.
Junhyung Jeong +6 more
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Vertical Gallium Nitride (GaN) Transistors For Extreme Environments
openaire +2 more sources
Reflection coefficient and optical conductivity of gallium nitride GaN [PDF]
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