Results 191 to 200 of about 7,995 (228)
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Investigation of Anomaly in GaN HEMTs

Journal of The Electrochemical Society, 2008
Electron trapping after on-state stress and hole trapping after off-state breakdown stress have been observed by comparing the electroluminescence (EL) images and electrical characteristics in GaN high electron mobility transistors (HEMTs). Temperature measurement and two-dimensional device simulation have been done to confirm the hole-trapping ...
Hsiang Chen   +3 more
openaire   +1 more source

GaN HEMTs Design and Modeling for 5G

2023 IEEE International Reliability Physics Symposium (IRPS), 2023
Yueying Liu   +8 more
openaire   +1 more source

High frequency GaN HEMT Modeling with ASM-HEMT

2022 17th European Microwave Integrated Circuits Conference (EuMIC), 2022
R. Sommet   +3 more
openaire   +1 more source

Lateral GaN HEMT Structures

2018
This chapter describes the basic GaN-based HEMT device, including the polarization effects and surface states responsible for the formation of the 2DEG in AlGaN/GaN heterostructures. GaN HEMT device structure innovations for increasing the channel mobility, reducing the current collapse phenomena, achieving high voltage breakdown, and enabling normally
openaire   +1 more source

Electroluminescence in AlGaN/GaN HEMTs

2002
EL distribution was measured by combining an objective lens (*100) and a CCD camera. After EL signal image was obtained in the dark, top-view image of the device was also taken under illumination. We could precisely study the EL distribution on the device by superimposing these two images.
openaire   +1 more source

Wafer-scale high sensitive UV photodetectors based on novel AlGaN/n-GaN/p-GaN heterostructure HEMT

Applied Surface Science, 2023
Wanglong Wu   +2 more
exaly  

High Power Normally-OFF GaN/AlGaN HEMT with Regrown p Type GaN

Energies, 2021
Gwen Rolland   +2 more
exaly  

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