Results 191 to 200 of about 14,573 (221)
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Extended Abstracts of the 1999 International Conference on Solid State Devices and Materials, 1999
N.-Q. Zhang +5 more
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N.-Q. Zhang +5 more
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Electroluminescence in AlGaN/GaN HEMTs
2002EL distribution was measured by combining an objective lens (*100) and a CCD camera. After EL signal image was obtained in the dark, top-view image of the device was also taken under illumination. We could precisely study the EL distribution on the device by superimposing these two images.
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Wafer-scale high sensitive UV photodetectors based on novel AlGaN/n-GaN/p-GaN heterostructure HEMT
Applied Surface Science, 2023Wanglong Wu, Chuankai Liu, Lixiang Han
exaly
An Actively-Passivated p-GaN Gate HEMT With Screening Effect Against Surface Traps
IEEE Electron Device Letters, 2023Yanlin Wu, Maojun Wang, Muqin Nuo
exaly
Commercialization of 600V GaN HEMTs
Extended Abstracts of the 2014 International Conference on Solid State Devices and Materials, 2014P. Parikh +20 more
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Evaluation and Application of 600 V GaN HEMT in Cascode Structure
IEEE Transactions on Power Electronics, 2014Xiucheng Huang, Zhengyang Liu, Qiang Li
exaly

