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Investigation of Anomaly in GaN HEMTs
Journal of The Electrochemical Society, 2008Electron trapping after on-state stress and hole trapping after off-state breakdown stress have been observed by comparing the electroluminescence (EL) images and electrical characteristics in GaN high electron mobility transistors (HEMTs). Temperature measurement and two-dimensional device simulation have been done to confirm the hole-trapping ...
Hsiang Chen +3 more
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GaN HEMTs Design and Modeling for 5G
2023 IEEE International Reliability Physics Symposium (IRPS), 2023Yueying Liu +8 more
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High frequency GaN HEMT Modeling with ASM-HEMT
2022 17th European Microwave Integrated Circuits Conference (EuMIC), 2022R. Sommet +3 more
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2018
This chapter describes the basic GaN-based HEMT device, including the polarization effects and surface states responsible for the formation of the 2DEG in AlGaN/GaN heterostructures. GaN HEMT device structure innovations for increasing the channel mobility, reducing the current collapse phenomena, achieving high voltage breakdown, and enabling normally
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This chapter describes the basic GaN-based HEMT device, including the polarization effects and surface states responsible for the formation of the 2DEG in AlGaN/GaN heterostructures. GaN HEMT device structure innovations for increasing the channel mobility, reducing the current collapse phenomena, achieving high voltage breakdown, and enabling normally
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Electroluminescence in AlGaN/GaN HEMTs
2002EL distribution was measured by combining an objective lens (*100) and a CCD camera. After EL signal image was obtained in the dark, top-view image of the device was also taken under illumination. We could precisely study the EL distribution on the device by superimposing these two images.
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Wafer-scale high sensitive UV photodetectors based on novel AlGaN/n-GaN/p-GaN heterostructure HEMT
Applied Surface Science, 2023Wanglong Wu +2 more
exaly
High Power Normally-OFF GaN/AlGaN HEMT with Regrown p Type GaN
Energies, 2021Gwen Rolland +2 more
exaly

