Results 71 to 80 of about 6,652 (220)

Synthesis of Indium Nitride Epitaxial Layers on a Substrate of Porous Indium Phosphide [PDF]

open access: yesЖурнал нано- та електронної фізики, 2015
The paper presents a technique to obtain InN films on porous InP substrates by radical-beam gettering epitaxy. According to the results of the Auger spectroscopy, InN film thickness ranged from 100 nm to 0.5 microns depending on the etching conditions.
J.A. Suchikova
doaj  

Silicon solar cell process development, fabrication and analysis [PDF]

open access: yes
For UCP Si, randomly selected wafers and wafers cut from two specific ingots were studied. For the randomly selected wafers, a moderate gettering diffusion had little effect. Moreover, an efficiency up to 14% AMI was achieved with advanced processes. For
Iles, P. A., Leung, D. C.
core   +1 more source

Further study of inversion layer MOS solar cells [PDF]

open access: yes
A group of inversion layer MOS solar cells has been fabricated. The highest value of open-circuit voltage obtained for the cells is 0.568V. One of the cells has produced a short-circuit current of 79.6 mA and an open-circuit voltage of 0.54V.
Ho, Fat Duen
core   +1 more source

High efficiency solar cell processing [PDF]

open access: yes
At the time of writing, cells made by several groups are approaching 19% efficiency. General aspects of the processing required for such cells are discussed.
Ho, F., Iles, P. A.
core   +1 more source

The getters in silicon

open access: yesIzvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering, 2019
The processes of gettering of fast-diffusing metal impurities and structure defects in silicon, mainly used in the production of integrated circuits, power high-voltage devices, nuclear-doped silicon, are considered. The getters based on structural defects and gas-phase getters based on chlorine-containing compounds are analyzed.
openaire   +2 more sources

High purith low defect FZ silicon [PDF]

open access: yes
The most common intrinsic defects in dislocation-free float zone (FZ) silicon crystals are the A- and B-type swirl defects. The mechanisms of their formation and annihilation have been extensively studied.
Kimura, H., Robertson, G.
core   +1 more source

Studies of oxygen-related and carbon-related defects in high-efficiency solar cells [PDF]

open access: yes, 1985
Oxygen and carbon related defects in silicon, particularly as related to high-efficiency silicon solar cells were studied. A summary of oxygen processes in silicon versus process temperature was shown along with experimental results.
Corbett, J. W.
core   +1 more source

Impact of high-temperature processing steps on the long-term stability of charge carrier lifetime in n-type FZ-silicon

open access: yesEPJ Photovoltaics
In this work, the long-term behavior of excess charge carrier lifetime in n-type FZ-Si wafers without presence of highly doped layers is investigated during illumination at elevated temperatures.
Mehler Melanie   +5 more
doaj   +1 more source

Epitaxial solar cells fabrication [PDF]

open access: yes
Silicon epitaxy has been studied for the fabrication of solar cell structures, with the intent of optimizing efficiency while maintaining suitability for space applications.
Daiello, R. V.   +2 more
core   +1 more source

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