Magnetic doping of the topological insulator Bi2Te3 with erbium adatoms induces out‐of‐plane magnetism and breaks time‐reversal symmetry, opening a Dirac gap and driving a Fermi surface transition from hexagonal to star‐of‐David geometry. Microscopy, spectroscopy, and magnetic dichroism reveal atomically controlled magnetic interactions that tailor the
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Contact-dominated localized electric-displacement-field-enhanced pressure sensing. [PDF]
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Controllable growth of MoO<sub>3</sub> dielectrics with sub-1 nm equivalent oxide thickness for 2D electronics. [PDF]
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Investigation of gate dielectric interface on contact resistance of short channel organic thin film transistors (OTFT). [PDF]
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High-κ dielectric van der Waals integration on 2D semiconductors for three-dimensional complementary logic systems. [PDF]
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Synthesis of crystalline polyamide for synergistically strengthening anticorrelated mechanical property and high-temperature capacitive energy storage. [PDF]
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Numerical Study of the VDMOS with an Integrated High-K Gate Dielectric and High-K Dielectric Trench
2021 China Semiconductor Technology International Conference (CSTIC), 2021The VDMOS with an integrated high-k gate dielectric and high - k dielectric trench is investigated in this paper. The high-k (HK) dielectric is applied both for the gate dielectric and trench, which improves the performance without increasing the process complexity.
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Reliability characteristics of high-k dielectrics
Microelectronics Reliability, 2004Abstract In this paper, recent results of Weibull slopes, area scaling factors, and breakdown behaviors observed for both soft breakdown and hard breakdown are discussed. These results would help to shed light on the breakdown mechanism of HfO 2 gate dielectrics.
Young-Hee Kim, Jack C. Lee
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Trapping in high-k dielectrics
Applied Physics Letters, 2010In this paper, an analytical model of trapping in high-k dielectrics is proposed. It starts from the general rate equation and relies on the hypothesis that the density of states involved in the capture mechanism follows a Fermi-like distribution. Thus, the energy depth of the trap level respect to the Fermi level is explicited in the model.
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