Results 11 to 20 of about 85,220 (297)

Counter-Doped Multizone Junction Termination Extension Structures in Vertical GaN Diodes

open access: yesIEEE Journal of the Electron Devices Society, 2019
GaN is an attractive wide bandgap semiconductor for power applications, owing to its superior electrical properties, such as high critical electric field and saturation drift velocity.
Mohammed Shurrab   +2 more
doaj   +1 more source

A novel high‐efficient step‐up converter with continuous input current, common ground, and minimum stress on semiconductors

open access: yesIET Power Electronics, 2023
This study proposes a comprehensive analysis of a novel non‐isolated step‐up converter with continuous input current and common ground. The proposed topology provides high voltage gain besides insignificant voltage and current stress across switches and ...
Reza Asgarnia, Ebrahim Afjei
doaj   +1 more source

RF Characterization of NiO and TiO2 Based Metal-Insulator-Metal (MIM) Diodes on Flexible Substrates

open access: yesIEEE Access, 2018
This paper presents the fabrication and characterization of metal-insulator-metal (MIM) diodes on flexible substrates for RF and microwave circuit applications.
Amanpreet Kaur, Premjeet Chahal
doaj   +1 more source

Theoretical and Experimental Studies of Schottky Diodes That Use Aligned Arrays of Single Walled Carbon Nanotubes [PDF]

open access: yes, 2010
We present theoretical and experimental studies of Schottky diodes that use aligned arrays of single walled carbon nanotubes. A simple physical model, taking into account the basic physics of current rectification, can adequately describe the single-tube
A. A. Pesetski   +40 more
core   +2 more sources

Phase cascade lattice rectifier array: an exactly solvable nonlinear network circuit [PDF]

open access: yes, 2018
An exact analysis of a 2-D lattice network consisting of N × N sites with rectifier and AC source elements with controllable phases reveals a method for generating ripple-free DC power without the use of any filtering circuit elements.
Chen, J.   +6 more
core   +1 more source

Ideal GaP surface-barrier diodes

open access: yesElectronics Letters, 1971
The properties of GaP diodes with metal?semiconductor (m.s.) potential barriers are described. The structure was manufactured by the chemical deposition of metal (gold or metal) on the n GaP surface. The properties of these m.s. structures (forward current/voltage and photocurrent/photon-energy characteristics and typical parameters) are extremely ...
YU.A. Goldberg   +2 more
openaire   +1 more source

The Infiltration of Silver Nanoparticles into Porous Silicon for Improving the Performance of Photonic Devices

open access: yesNanomaterials, 2022
Hybrid nanostructures have a great potential to improve the overall properties of photonic devices. In the present study, silver nanoparticles (AgNPs) were infiltrated into nanostructured porous silicon (PSi) layers, aiming at enhancing the ...
Rehab Ramadan, Raúl J. Martín-Palma
doaj   +1 more source

Comparison of an open-hardware electroencephalography amplifier with medical grade device in brain-computer interface applications [PDF]

open access: yes, 2016
Brain-computer interfaces (BCI) are promising communication devices between humans and machines. BCI based on non-invasive neuroimaging techniques such as electroencephalography (EEG) have many applications , however the dissemination of the technology ...
Frey, Jérémy
core   +3 more sources

The Development of Frequency Multipliers for Terahertz Remote Sensing System

open access: yesRemote Sensing, 2022
This paper summarizes the development of novel Schottky-diode-based terahertz frequency multipliers. The basic structure and manufacturing process of planar Schottky barrier diodes (SBDs) are reviewed, along with other diode structures that have been ...
Yong Zhang   +7 more
doaj   +1 more source

Near-ideal platinum-GaN Schottky diodes

open access: yesElectronics Letters, 1996
Fabrication and characterisation of nearly ideal Pt/n-GaN Schottky barrier diodes are described. The n-GaN employed was grown by the reactive molecular beam epitaxy method. The capacitance/voltage (C/V) characteristics indicate marginal trap density in the semiconductor, and the current/voltage (I/V) characteristics give an ideality factor very close ...
S.N. Mohammad   +6 more
openaire   +1 more source

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