Results 191 to 200 of about 657,295 (208)
Some of the next articles are maybe not open access.
Real-Time Aging Monitoring for IGBT Modules Using Case Temperature
IEEE Transactions on Industrial Electronics, 2016Liyan Qu, Wei Qiao, Ze Wang
exaly
The Effect of Electro-Thermal Parameters on IGBT Junction Temperature With the Aging of Module
Microelectronics Reliability, 2016Lingling Li
exaly
Monitoring Potential Defects in an IGBT Module Based on Dynamic Changes of the Gate Current
IEEE Transactions on Power Electronics, 2013Pengju Sun, Shengqi Zhou, Luowei Zhou
exaly
Reliability of non-hermetic pressure contact IGBT modules
Microelectronics Reliability, 2001Reinhard Schlegel, E. Herr, F. Richter
openaire +2 more sources

