Results 11 to 20 of about 575,300 (214)

Investigation of impact of the gate circuitry on IGBT transistor dynamic parameters

open access: yesMokslas: Lietuvos Ateitis, 2010
The impact of Insulated Gate Bipolar Transistor driver circuit parameters on the rise and fall time of the collector current and voltage collector-emitter was investigated.
Vytautas Bleizgys, Andrius Platakis
doaj   +2 more sources

Insulated Gate Bipolar Transistor Solder Layer Defect Detection Research Based on Improved YOLOv5

open access: yesApplied Sciences, 2022
The expanding market scale of the insulated gate bipolar transistor as a new type of power semiconductor device has higher insulated gate bipolar transistor soldering requirements. However, there are some small bubbles difficult to detect.
Qiying Ling   +3 more
doaj   +2 more sources

Development of 8-inch Key Processes for Insulated-Gate Bipolar Transistor

open access: yesEngineering, 2015
Based on the construction of the 8-inch fabrication line, advanced process technology of 8-inch wafer, as well as the fourth-generation high-voltage double-diffused metal-oxide semiconductor (DMOS+) insulated-gate bipolar transistor (IGBT) technology and
Guoyou Liu, Rongjun Ding, Haihui Luo
doaj   +2 more sources

INSULATED-GATE BIPOLAR TRANSISTOR FORMED IN THE BULK SILICON AND USING «SILICON ON INSULATOR» TECHNOLOGY

open access: yesДоклады Белорусского государственного университета информатики и радиоэлектроники, 2019
The results of the optimization of design and technological parameters device structures insulated-gate bipolar transistor (IGBT), formed in bulk silicon and using «Silicon on Insulator» (SOI) technology are presented.
S. Ibrahim   +2 more
doaj   +1 more source

Neuromorphic Devices and Computing for Sensing, Memory, and Control. [PDF]

open access: yesAdv Sci (Weinh)
This review introduces neuromorphic devices made from diverse materials. These devices mimic neuronal functions and architectures and, when integrated with artificial or biological computing, can form closed loops with neurons for pressure, optical, acoustic, and biochemical sensing and modulation.
Zhu Z, Schaffer N, Yang X.
europepmc   +2 more sources

Improving reliability in electric drive systems during IGBT short‐circuit fault

open access: yesIET Power Electronics, 2021
To improve the reliability of electric drive systems during the insulated‐gate bipolar transistor short‐circuit fault, a control method is proposed for Y‐connected 3‐phase induction motors.
Maryam Naghavi   +3 more
doaj   +1 more source

Simulation Study of 4H-SiC Trench Insulated Gate Bipolar Transistor with Low Turn-Off Loss. [PDF]

open access: yesMicromachines (Basel), 2019
In this work, an insulated gate bipolar transistor (IGBT) is proposed that introduces a portion of the p-polySi/p-SiC heterojunction on the collector side to reduce the tail current during device turn-offs.
Mao HK, Wang Y, Wu X, Su FW.
europepmc   +2 more sources

Comparative study of electro‐thermal characteristics of 4500 V diffusion‐CS IGBT and buried‐CS IGBT

open access: yesIET Circuits, Devices and Systems, 2021
This article compares the major characteristics of the Insulated Gate Bipolar Transistor with Diffusion Carrier Stored (CS) layer (DCS‐IGBT) and the Insulated Gate Bipolar Transistor with the Buried CS layer (BCS‐IGBT).
Rui Jin   +6 more
doaj   +1 more source

Simulation Study on Dynamic and Static Characteristics of Novel SiC Gate-Controlled Bipolar-Field-Effect Composite Transistor

open access: yesIEEE Journal of the Electron Devices Society, 2020
In this article, a novel bipolar-field-effect composite power transistor, called SiC GCBT (Silicon Carbide Gate-Controlled Bipolar-field-effect Composite Transistor) is presented and studied.
Yipan Zhang, Baoxing Duan, Yintang Yang
doaj   +1 more source

Experimental investigation on the single event gate rupture and hardening of the 600 V trench IGBT

open access: yesAIP Advances, 2021
In this paper, a single particle irradiation experiment is performed on the 600 V trench insulated gate bipolar transistor for the first time. The experimental results show that, at the collector voltages of 100 V and 300 V, single event gate rupture ...
Zhichao Wei   +6 more
doaj   +1 more source

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