Results 21 to 30 of about 2,111,321 (211)

Direct observation of localized surface plasmon field enhancement by Kelvin probe force microscopy. [PDF]

open access: yesLight Sci Appl, 2017
A surface plasmon (SP) is a fundamental excitation state that exists in metal nanostructures. Over the past several years, the performance of optoelectronic devices has been improved greatly via the SP enhancement effect.
Li DB   +7 more
europepmc   +2 more sources

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices [PDF]

open access: yesBeilstein Journal of Nanotechnology, 2015
Frequency modulated Kelvin probe force microscopy (FM-KFM) is the method of choice for high resolution measurements of local surface potentials, yet on coarse topographic structures most researchers revert to amplitude modulated lift-mode techniques for ...
Tino Wagner   +6 more
doaj   +2 more sources

Quantitative AC - Kelvin Probe Force Microscopy

open access: yesMicroelectronic Engineering, 2017
This paper presents a novel feedback based Scanning Probe Microscopy method which enables quantitative surface potential measurements without the need of the DC bias of Kelvin Probe Force Microscopy. In addition to the sinusoidal excitation signal at frequency , a sinusoidal signal with the frequency 2 is applied to the conductive cantilever.
Kohl, Dominik   +2 more
openaire   +5 more sources

Imaging Graphene Moiré Superlattices via Scanning Kelvin Probe Microscopy. [PDF]

open access: yesNano letters (Print), 2021
Moiré superlattices in van der Waals heterostructures are gaining increasing attention because they offer new opportunities to tailor and explore unique electronic phenomena.
Junxi Yu   +7 more
semanticscholar   +1 more source

In situ microscopic investigation of ion migration on the surface of chromium coated steels

open access: yesnpj Materials Degradation, 2022
Cathodic spreading of electrolyte on two-layers chromium coatings electrodeposited from trivalent chromium electrolyte on steel was studied on the micro- and the macroscale. The behavior is discussed in view of results obtained on electrical conductivity
J. Manoj Prabhakar   +2 more
doaj   +1 more source

Kelvin probe force microscopy for material characterization [PDF]

open access: yesMicroscopy, 2022
Abstract Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic force microscopy. The surface potential is one of the most important surface properties and is correlated to e.g. the work function, surface dipoles, localized surface charges and structural properties.
Thilo Glatzel, Urs Gysin, Ernst Meyer
openaire   +3 more sources

Single-Bilayer Graphene Test Structures for Kelvin Probe Microscopy

open access: yesC, 2023
A new technique for determining the point spread function, which is required for measuring the surface potential using Kelvin probe microscopy (KPM), is presented. The method involves using a silicon carbide substrate coated with single-layer and bilayer
Sergey P. Lebedev   +4 more
doaj   +1 more source

Quantification of Hydrogen Flux from Atmospheric Corrosion of Steel Using the Scanning Kelvin Probe Technique

open access: yesMetals, 2023
The atmospheric corrosion of high-strength steels can lead to hydrogen absorption directly linked to hydrogen embrittlement or delayed fracture phenomena.
Flavien Vucko   +2 more
doaj   +1 more source

KELVIN PROBE’S STRAY CAPACITANCE AND NOISE SIMULATION

open access: yesПриборы и методы измерений, 2015
Stray capacitance effects and their influence on Kelvin probe’s performance are studied using mathematical and computer simulation. Presence of metal surface, even grounded, in vicinity of vibrating Kelvin probe produces the additional stray signal of ...
S. Danyluk   +7 more
doaj   +1 more source

Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications. [PDF]

open access: yesPLoS ONE, 2017
Charge trapping properties of electrons and holes in copper-doped zinc oxide (ZnO:Cu) films have been studied by scanning probe microscopy. We investigated the surface potential dependence on the voltage and duration applied to the copper-doped ZnO films
Ting Su, Haifeng Zhang
doaj   +1 more source

Home - About - Disclaimer - Privacy