Results 31 to 40 of about 25,733 (269)
Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications. [PDF]
PLoS ONE, 2017 Charge trapping properties of electrons and holes in copper-doped zinc oxide (ZnO:Cu) films have been studied by scanning probe microscopy. We investigated the surface potential dependence on the voltage and duration applied to the copper-doped ZnO films
Ting Su, Haifeng Zhang
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MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy
Crystals, 2020 A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko +3 more
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Calibrated work function mapping by Kelvin probe force microscopy.
Review of Scientific Instruments, 2018 We propose and demonstrate the implementation of an alternative work function tip calibration procedure for Kelvin probe force microscopy under ultrahigh vacuum, using monocrystalline metallic materials with known crystallographic orientation as reference samples, instead of the often used highly oriented pyrolytic graphite calibration sample.
Pablo A Fernández Garrillo +3 more
semanticscholar +5 more sources
ARMScope – the versatile platform for scanning probe microscopy systems
Metrology and Measurement Systems, 2020 Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator.
Świadkowski Bartosz +8 more
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Communications Chemistry, 2021 Rutile TiO2 is a prominent photocatalyst for overall water splitting, but the on-surface activation of hydrogen atoms is still not fully understood. Here, the authors use atomic force and kelvin probe force microscopy to study the lateral manipulation of
Yuuki Adachi +3 more
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High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers
IEEE Access, 2019 Simultaneous and rapid measurement of the surface potential (SP) and nanomechanical properties (NMPs) of materials plays an important role in the study of, for example, piezoelectric materials and multi-component composites.
Hao Zhang +5 more
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Resolving surface potential variation in Ge/MoS2 heterostructures with Kelvin probe force microscopy
AIP Advances, 2021 In this work, we employ an atomic force microscopy-based technique, Kelvin probe force microscopy, to analyze heterogeneities of four different 2D/3D Ge/MoS2 heterostructures with Ge chemical vapor deposition (CVD) time.
Sanguk Woo +6 more
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Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation [PDF]
Physical Review Applied, 2015 We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning as it requires no low frequency modulation.
Miyahara, Yoichi +3 more
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Beilstein Journal of Nanotechnology, 2011 The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions.
Miriam Jaafar +5 more
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High spatial resolution Kelvin probe force microscopy with coaxial probes [PDF]
Nanotechnology, 2012 Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic ...
Brown, Keith A. +2 more
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