Results 41 to 50 of about 25,733 (269)

Thin NaCl films on silver (001): island growth and work function

New Journal of Physics, 2012
The surface work function (WF) and substrate temperature dependence of the NaCl thin-film growth on Ag(001) have been studied by noncontact atomic force microscopy and Kelvin probe force microscopy.
Gregory Cabailh, Claude R Henry, Clemens Barth   +2 more
doaj   +1 more source

The role of the cantilever in Kelvin probe force microscopy measurements

Beilstein Journal of Nanotechnology, 2011
The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
George Elias, Thilo Glatzel, Ernst Meyer, Alex Schwarzman, Amir Boag, Yossi Rosenwaks   +5 more
doaj   +1 more source

Calibrated Kelvin-probe force microscopy of 2D materials using Pt-coated probes

Journal of Physics Communications, 2020
Nanoscale characterization techniques are fundamental to continue increasing the performance and miniaturization of consumer electronics. Among all the available techniques, Kelvin-probe force microscopy (KPFM) provides nanoscale maps of the local work ...
Eli G. Castanon, A. Fernández Scarioni, H. Schumacher, S. Spencer, R. Perry, J. Vicary, C. Clifford, H. Corte-León   +7 more
semanticscholar   +1 more source

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

Beilstein Journal of Nanotechnology, 2015
Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin, Thilo Glatzel, Thomas Schmölzer, Adolf Schöner, Sergey Reshanov, Holger Bartolf, Ernst Meyer   +6 more
doaj   +1 more source

The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

AIP Advances, 2013
The resistive switching characteristics of TiO2 thin films were investigated using conductive atomic force microscopy (CAFM) and Kelvin probe force microscopy (KPFM).
Yuanmin Du, Amit Kumar, Hui Pan, Kaiyang Zeng, Shijie Wang, Ping Yang, Andrew Thye Shen Wee   +6 more
doaj   +1 more source

Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy

Materials Research Express, 2020
In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors.
Manoj Vishwakarma, Deepak Varandani, Mylene Hendrickx, Joke Hadermann, B R Mehta   +4 more
doaj   +1 more source

Enhancing Low‐Temperature Performance of Sodium‐Ion Batteries via Anion‐Solvent Interactions

Advanced Functional Materials, EarlyView.
DOL is introduced into electrolytes as a co‐solvent, increasing slat solubility, ion conductivity, and the de‐solvent process, and forming an anion‐rich solvent shell due to its high interaction with anion. With the above virtues, the batteries using this electrolyte exhibit excellent cycling stability at low temperatures. Abstract Sodium‐ion batteries
Cheng Zheng, Qian Yao, Yanan Sun, Hongyu Lv, Zhongchao Bai, Guoliang Zhang, Nana Wang, Jian Yang   +7 more
wiley   +1 more source

Fractional Skyrmion Tubes in Chiral‐Interfaced 3D Magnetic Nanowires

Advanced Functional Materials, EarlyView.
In chiral 3D helical magnetic nanowires, the coupling between the geometric and magnetic chirality provides a way to create topological spin states like vortex tubes. Here, it is demonstrated how the breaking of this coupling in interfaced 3D nanowires of opposite chirality leads to even more complex topological spin states, such as fractional ...
John Fullerton, Naëmi Leo, Jakub Jurczyk, Claire Donnelly, Dédalo Sanz‐Hernández, Luka Skoric, Nicholas Mille, Stefan Stanescu, Donald A MacLaren, Rachid Belkhou, Aurelio Hierro‐Rodriguez, Amalio Fernández‐Pacheco   +11 more
wiley   +1 more source

Z‐Scheme Water Splitting Systems Based on Solid‐State Electron Conductors

Advanced Functional Materials, EarlyView.
This review examines the latest advances in Z‐scheme overall water splitting (OWS) systems for solar hydrogen production. These systems consist of suspended or immobilized hydrogen evolution photocatalysts (HEPs) and oxygen evolution photocatalysts (OEPs).
Chen Gu, Takashi Hisatomi, Tsuyoshi Takata, Kazunari Domen   +3 more
wiley   +1 more source

Charge erasure analysis on the nanoscale using Kelvin probe force microscopy

AIP Advances, 2017
The charge pattern produced by atomic force microscopy on an insulating surface can be detected on the nanoscale using Kelvin probe force microscopy. Recent applications of charge patterns include data storage, nano-xerography, and charge writing.
Shi-quan Lin, Tian-min Shao
doaj   +1 more source