Results 41 to 50 of about 25,000 (165)

Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation [PDF]

Physical Review Applied, 2015
We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning as it requires no low frequency modulation.
Miyahara, Yoichi, Topple, Jessica, Schumacher, Zeno, Grutter, Peter   +3 more
openaire   +2 more sources

Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

Beilstein Journal of Nanotechnology, 2011
The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions.
Miriam Jaafar, Oscar Iglesias-Freire, Luis Serrano-Ramón, Manuel Ricardo Ibarra, Jose Maria de Teresa, Agustina Asenjo   +5 more
doaj   +1 more source

Investigation of Kelvin probe force microscopy efficiency for the detection of hydrogen ingress by cathodic charging in an aluminium alloy [PDF]

, 2013
Detecting and locating absorbed hydrogen in aluminium alloys is necessary for evaluating the contribution of hydrogen embrittlement to the degradation of the mechanical properties for corroded or cathodically hydrogen-charged samples.
Alexis, Joël, Andrieu, Eric, Blanc, Christine, Lacroix, Loïc, Larignon, Céline, Odemer, Grégory   +5 more
core   +2 more sources

Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements [PDF]

, 2010
Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements.
Kim, W. J., Schwarz, U. D.
core   +1 more source

An upper bound for the magnetic force gradient in graphite

, 2010
Cervenka et al. have recently reported ferromagnetism along graphite steps. We present Magnetic Force microscopy (MFM) data showing that the signal along the steps is independent of an external magnetic field.
Agustina Asenjo, David Martínez-Martín, H. Luth, Julio Gómez-Herrero, Miriam Jaafar, Rubén Pérez   +5 more
core   +1 more source

The role of the cantilever in Kelvin probe force microscopy measurements

Beilstein Journal of Nanotechnology, 2011
The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
George Elias, Thilo Glatzel, Ernst Meyer, Alex Schwarzman, Amir Boag, Yossi Rosenwaks   +5 more
doaj   +1 more source

Conduction of topologically-protected charged ferroelectric domain walls

, 2011
We report on the observation of nanoscale conduction at ferroelectric domain walls in hexagonal HoMnO3 protected by the topology of multiferroic vortices using in situ conductive atomic force microscopy, piezoresponse force microscopy, and kelvin-probe ...
J. R. Guest, M. E. Lines, N. Lee, P. M. Chaikin, S.-W. Cheong, Weida Wu, Y. Horibe   +6 more
core   +1 more source

The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

AIP Advances, 2013
The resistive switching characteristics of TiO2 thin films were investigated using conductive atomic force microscopy (CAFM) and Kelvin probe force microscopy (KPFM).
Yuanmin Du, Amit Kumar, Hui Pan, Kaiyang Zeng, Shijie Wang, Ping Yang, Andrew Thye Shen Wee   +6 more
doaj   +1 more source

Combination of AFM, SKPFM, and SIMS to Study the Corrosion Behavior of S-phase particles in AA2024-T351 [PDF]

, 2008
The dissolution mechanism of S-phase particles in 2024-T351 aluminum alloy at open-circuit potential in chloride-containing sulfate solutions was investigated using atomic force microscopy (AFM), scanning Kelvin probe force microscopy (SKPFM), and ...
Blanc, Christine, Lacroix, Loïc, Mankowski, Georges, Ressier, Laurence   +3 more
core   +3 more sources

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

Beilstein Journal of Nanotechnology, 2015
Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin, Thilo Glatzel, Thomas Schmölzer, Adolf Schöner, Sergey Reshanov, Holger Bartolf, Ernst Meyer   +6 more
doaj   +1 more source