Results 151 to 160 of about 4,574 (190)
Effect of the instrumental parameters on the SP measures of KPFM under ambient conditions
Mpastas, N. +3 more
openaire +1 more source
Surface Potential of Chalcopyrite Films Measured by KPFM [PDF]
AbstractAtomic force microscopy is widely used to characterize the surface topography of a variety of samples. Kelvin probe force microscopy (KPFM) additionally allows determining images of the surface potential with nanometer resolution. The KPFM technique will be introduced and studies on surfaces of chalcopyrite semiconductors for solar cell ...
Sascha Sadewasser
exaly +4 more sources
KPFM - Raman Spectroscopy Coupled Technique for the Characterization of Wide Bandgap Semiconductor Devices [PDF]
A non-destructive technique for the characterization of the doped regions inside wide bandgap (WBG) semiconductor structures of power devices is presented. It consists in local measurements of the surface potential by Kelvin Probe Force Microscopy (KPFM) coupled to micro-Raman spectroscopy.
Louis Giraudet +2 more
exaly +7 more sources
Study of High-Low KPFM on a Pn-Patterned Si Surface.
Abstract Comparative measurements between frequency modulation Kelvin probe force microscopy (FM-KPFM) using low frequency bias voltage and heterodyne FM-KPFM using high frequency bias voltage were performed on the surface potential measurement. A silicon substrate patterned with p- and n-type impurities was used as a quantitative sample.
Yoshitaka Naitoh +2 more
exaly +3 more sources
Two different Kelvin Probe Force Microscopy (KPFM) measurement configurations have been combined to evaluate at the nanoscale the effects of an electrical stress on Organic Thin Film Transistors (OTFTs) properties. As an example, Channel Hot Carrier (CHC)
Marc Porti, Ana Ruiz, Sergi Claramunt
exaly +2 more sources
Towards Nanoscale Electrical Measurements in Liquid by Advanced KPFM Techniques: A Review
Abstract Fundamental mechanisms of energy storage, corrosion, sensing, and multiple biological functionalities are directly coupled to electrical processes and ionic dynamics at solid–liquid interfaces. In many cases, these processes are spatially inhomogeneous taking place at grain boundaries, step edges, point defects, ion channels,
Sergei V. Kalinin +2 more
exaly +4 more sources
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Greener Synthesis of CZTS: Structural, KPFM Studies
Materials Today: Proceedings, 2018Abstract Copper Zinc Tin sulfide (CZTS) has shown promising performance as an absorber semiconductor for solar cell devices. Due to its multicomponent nature, low cost synthesis method results in presence of secondary phases, which is nagging issue it affects optoelectronic properties.
B R Mehta, N Kumari
exaly +2 more sources
Contact Electrification and Charge Decay on Polyester Fibres: A KPFM Study
Abstract Surface contact electrification experiments have been performed on insulating polyester fibres in contact with a conductive fibre using biased atomic force microscopy tips. With positive tip bias, charge spots have been deposited in a reproducible manner.
Jun Yin, Bernard Nysten
exaly +3 more sources
Capacitive Crosstalk in AM-Mode KPFM
2011In Kelvin probe force microscopes based on electrostatic tip excitation, a nonnegligible capacitive crosstalk occurs between the electrostatic probe excitation signal and the probe deflection output signal. In atomic force microscopy setups where a self-oscillation force feedback loop is used, the parasitic coupling may also superpose onto the ...
Diesinger, H. +2 more
openaire +2 more sources
KPFM of Nanostructured Electrochemical Sensors
2018Integrating sensor arrays with microelectronic devices enables applications such as disease diagnostics and environmental monitoring. The most advanced chemical sensor concepts, compatible with integrated circuits, comprise a semiconductor with a nanostructured sensing area that can be modified to be more selective and sensitive to specific analytes ...
Alex Henning, Yossi Rosenwaks
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