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Artifacts in KPFM in FM, AM and Heterodyne AM Modes
Key Engineering Materials, 2014In this paper, the crosstalk in potential measurements caused by the topographic feedback and the resonance frequency in Kelvin probe force microscopy (KPFM) was investigated in frequency modulation (FM), amplitude modulation (AM) and heterodyne amplitude modulation (heterodyne AM) modes.
Zong Min Ma +7 more
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KPFM and PFM of Biological Systems
2011Surface potentials and electrostatic interactions in biological systems are key elements of cellular regulation and interaction. Examples include cardiac and muscular activity, voltage-gated ion channels, protein folding and assembly, and electroactive cells and electrotransduction.
B. J. Rodriguez, S. V. Kalinin
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Charge State of Steps on Anatase TiO2(1 0 1) at 78 K by AFM/KPFM
Applied Surface Science, 2023Yan Jun Li +2 more
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Quantitative 3D-KPFM Imaging With Simultaneous Electrostatic Force and Force Gradient Detection
Nanotechnology, 2015 Kelvin probe force microscopy (KPFM) is a powerful characterization technique for imaging local electrochemical and electrostatic potential distributions and has been applied across a broad range of materials and devices. Proper interpretation of the local KPFM data can be complicated, however, by convolution of the true surface potential under the tip
Sergei V. Kalinin +2 more
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Springer Series in Surface Sciences, 2018
Kelvin probe force microscopy (KPFM) has been widely used to map nanoscale surface potentials of materials in ambient and ultra-high vacuum environments. However, to study and ultimately understand charge-related processes, e.g., in biological systems or to further improve energy storage devices such as electrochemical batteries, nanoscale surface ...
Brian J. Rodriguez +2 more
exaly +2 more sources
Kelvin probe force microscopy (KPFM) has been widely used to map nanoscale surface potentials of materials in ambient and ultra-high vacuum environments. However, to study and ultimately understand charge-related processes, e.g., in biological systems or to further improve energy storage devices such as electrochemical batteries, nanoscale surface ...
Brian J. Rodriguez +2 more
exaly +2 more sources
Interpretation of KPFM Data with the Weight Function for Charges
2018The KPFM signal for systems containing local charges can be expressed as a weighted sum over all local charges. The weight function for charges quantifies the contribution of each charge, depending on its position. In this chapter, we evaluate the KPFM weight function for charges by analyzing several application-relevant model systems. The intention of
Hagen Söngen +3 more
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ACS Applied Materials & Interfaces, 2014
Here, we discuss the local photovoltaic characteristics of a structured bulk heterojunction, organic photovoltaic devices fabricated with a liquid carbazole, and a fullerene derivative based on analysis by scanning kelvin probe force microscopy (KPFM).
Satoshi, Watanabe +9 more
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Here, we discuss the local photovoltaic characteristics of a structured bulk heterojunction, organic photovoltaic devices fabricated with a liquid carbazole, and a fullerene derivative based on analysis by scanning kelvin probe force microscopy (KPFM).
Satoshi, Watanabe +9 more
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Imaging Static Charge Distributions: A Comprehensive KPFM Theory
2018We analyze Kelvin probe force microscopy (KPFM) for tip-sample systems that contain static charges by presenting a rigorous derivation for the respective KPFM signal in all common KPFM modes, namely amplitude modulation, frequency modulation, or heterodyne detection in the static, open-loop or closed-loop variant.
Philipp Rahe, Hagen Söngen
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Origin of the KPFM Contrast in the Adsorption of a Triphenylene Derivative on KBr(001)
2015The results of the study of the adsorption of 2,3,6,7,10,11-hexacyanopropyloxytriphenylene on KBr(001) by non-contact atomic force microscopy (nc-AFM) coupled to Kelvin probe force microscopy (KPFM) are presented. A particular emphasis is put on the KPFM measurements. In particular, the contrast in the Kelvin potential between a molecular monolayer and
Antoine Hinaut +3 more
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KPFM and XPS Metrology of Self-Assembled Monolayer Barrier for Copper Metallization
ECS Meeting Abstracts, 2018Silane based Self assembled monolayer (SAM) has been demonstrated as a diffusion barrier layer on lowK dielectrics for sub 10 nm Cu interconnects for Integrated Circuit (IC) applications. A key problem in developing barrier layer is its monitoring capability, especially its thickness, uniformity, its coverage and defect density.
Rakefet Ofek Almog +5 more
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