Results 171 to 173 of about 236 (173)
Some of the next articles are maybe not open access.
Study on power characteristics of deep sub-micron SOI RF LDMOS
Wuli Xuebao/Acta Physica Sinica, 2011exaly
Repetitive Pulse Testing for LDMOS Transistor Reliability
2024 IEEE International Reliability Physics Symposium (IRPS)Tianjiao Liu +2 more
openaire +1 more source

