Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control. [PDF]
Ortlepp I, Stauffenberg J, Manske E.
europepmc +1 more source
Design and Performance of a Spatial 6-RRRR Compliant Parallel Nanopositioning Stage. [PDF]
Wang R, Wu H.
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Fourier ellipsometry - An ellipsometric approach to Fourier scatterometry [PDF]
Fodor, Bálint +4 more
core +1 more source
Cross-scale high-bandwidth atomic force microscopy with a stick-slip nanopositioner. [PDF]
Wang X +5 more
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High Bandwidth Control of a Piezo-Actuated Nanopositioning System Based on a Discrete-Time High-Order Dual-Loop Framework. [PDF]
Yu L, Zhang X, Fatikow S.
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Tip-enhanced nanocavities amplify the sum frequency generation. [PDF]
Yu CC, Jing Y, Xiong W.
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Backstepping Controller for Nanopositioning in Piezoelectric Actuators with ANN Hysteresis Compensation. [PDF]
Del Rio A +4 more
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Ultranarrow Line Width Room-Temperature Single-Photon Source from Perovskite Quantum Dot Embedded in Optical Microcavity. [PDF]
Farrow T +7 more
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