Results 121 to 130 of about 5,324 (209)

Power-Law Reliability Plotting for Microelectronics. [PDF]

Micromachines (Basel)
Bernstein JB.
europepmc   +1 more source

Editorial for the Special Issue on MEMS/NEMS Devices and Applications, 3rd Edition. [PDF]

Micromachines (Basel)
Dai ZX, Ono T, Dai CL.
europepmc   +1 more source

Enhanced Proton Transport in Nb-Doped Rutile TiO₂: A Highly Useful Class of Proton-Conducting Mixed Ionic Electronic Conductors. [PDF]

J Am Chem Soc
Shiraiwa T, Yamasaki T, Kushimoto K, Kano J, Omata T.   +4 more
europepmc   +1 more source

A Stepped-Spacer FinFET Design for Enhanced Device Performance in FPGA Applications. [PDF]

Micromachines (Basel)
Zareiee M, Mehrad M, Tawfik A.
europepmc   +1 more source

Intelligence prediction of integrated circuit reliability based on SSA-LSTM fusion architecture. [PDF]

PLoS One
Qian Y, Liu B, Su B, Zhang C.
europepmc   +1 more source

Activities of the Novel Bacterial Topoisomerase Inhibitor OSUAB-0284 against the Biothreat Pathogen <i>Bacillus anthracis</i> and Its Type II Topoisomerases. [PDF]

ACS Infect Dis
Mann CA, Halasohoris SA, Gray AM, Chua J, Spencer JL, Curry BJ, Babyak AL, Klimko CP, Cote CK, West JS, Mitton-Fry MJ, Meinig JM, Osheroff N.   +12 more
europepmc   +1 more source

Membrane transport of root-borne trans-zeatin riboside maintains the cytokinin homeostasis in shoots. [PDF]

J Exp Bot
Nedvěd D, Hudeček M, Klíma P, Lacek J, Müller K, Kuchařová A, Hošek P, Šmeringai J, Pernisová M, Motyka V, Plíhal O, Hoyerová K.   +11 more
europepmc   +1 more source

A Narrative Review of Advancements in Magnetic Resonance Imaging (MRI) Technology: Evaluating the Shift From Helium-Cooled to Helium-Free Systems. [PDF]

Cureus
Alenezi MM, Alqahtani S, Alqahtani H, Alasmari S, Alyami N, Alenzi F, Alanazi SF.   +6 more
europepmc   +1 more source

Real-Time Monitoring Method and Circuit Based on Built-In Reliability Prediction. [PDF]

Micromachines (Basel)
Ren W, Chen Y, Li X, Zhou X, Song B, Chang T.   +5 more
europepmc   +1 more source

Stability and Reliability of van der Waals High-κ SrTiO₃ Field-Effect Transistors with Small Hysteresis. [PDF]

ACS Nano
Sattari-Esfahlan SM, Yang AJ, Ghosh R, Zheng W, Rzepa G, Knobloch T, Lanza M, Renshaw Wang X, Grasser T.   +8 more
europepmc   +1 more source