Results 101 to 110 of about 5,324 (209)

Generation of Minimum Leakage Input Vectors with Constrained NBTI Degradation

, 2009
Technology scaling has caused Negative Bias Temperature Instability (NBTI) to emerge as a major circuit reliability concern. Simultaneously leakage power is becoming a greater fraction of the total power dissipated by logic circuits.
Jangir, Ram Rakesh, Erik, Larsson, Subramanyan, Pramod, Tudu, Jaynarayan, Singh, Virendra   +4 more
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Ring oscillator switching noise under NBTI wearout

In this paper the switching noise of a CMOS ring oscillator has been analysed when their pFETs are subjected to negative bias temperature instability (NBTI).
Morata Cariñena, Marta, Gil Galí, Ignacio, Fernández García, Raúl, Ruiz, José María   +3 more
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Penelope: The NBTI-aware processor

Transistors consist of lower number of atoms with every technology generation. Such atoms may be displaced due to the stress caused by high temperature, frequency and current, leading to failures.
González Colás, Antonio María, Abella Ferrer, Jaume, Vera Rivera, Francisco Javier   +2 more
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NBTI characteristics of p-MOSFETs under external mechanical stress

, 2009
In this thesis, in order to eliminate process issue, an external mechanical uniaxial tensile and compressive stress applied on p-type metal-oxide-semiconductor field effect transistors (p-MOSFETs) is used for the study of negative bias temperature ...
Hsiao, Po-wen
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Testing, diagnosis and repairing methods for NBTI-induced SRAM faults

, 2014
This item is available only to currently enrolled UTSA students, faculty or staff. To download, navigate to Log In in the top right-hand corner of this screen, then select Log in with my UTSA ID.Negative Bias Temperature Instability (NBTI) is a major ...
Chen, Chiung-Hung
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Power-Gating: More Than Leakage Savings [PDF]

, 2010
Macii, Enrico, Poncino, Massimo, Calimera, Andrea   +2 more
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Contribution to the NBTI effect study in MOS devices

122 p. : ill. ; 30 cmThis thesis delves into the Negative Bias Temperature Instability (NBTI) effect in Metal-OxideSemiconductor (MOS) devices, specifically Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs). The study comprehensively examines
Messaoud, DhiaElhak, Djezzar, Boualem(Directeur de thèse)   +1 more
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Novel Bacterial Topoisomerase Inhibitors: A New Front in an Old War. [PDF]

J Mol Biol
Mann CA, Dewar JM, Osheroff N.
europepmc   +1 more source

Designing the DNA-Intercalating Moiety to Improve the Safety and Efficacy of Novel Bacterial Topoisomerase Inhibitors. [PDF]

J Med Chem
Zorman M, Zajec Ž, Zdovc I, Senerovic L, Radakovic N, Atanaskovic M, Anderluh M, Minovski N, Hrast Rambaher M.   +8 more
europepmc   +1 more source

Multiscale Mechanical Responses of the Racetrack NbTi Superconducting Coil Under Dynamic Pressures. [PDF]

Materials (Basel)
Liu W, Wang L, Ma P, Li Y, Zhang W, Yu P, Chen Q, Wang Y, Zhang W.   +8 more
europepmc   +1 more source