Results 101 to 110 of about 5,421 (173)
Online Nbti Wear-out Estimation [PDF]
CMOS feature size scaling has been a source of dramatic performance gains, but it has come at a cost of on-chip wear-out. Negative Bias Temperature Instability (NBTI) is one of the main on-chip wear-out problems which questions the reliability of a chip.
Dabhoiwala, Mehernosh H
core +1 more source
, 2006 Negative Bias Temperature Instability (NBTI) is studied in ultrathin Si oxynitride (SiON) films made by thermal (TNO) and plasma (PNO) processes. Threshold voltage degradation (Delta V(T)) and recovery during and after NBTI stress are explained by ...
D. Varghese +11 more
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Contribution to the NBTI effect study in MOS devices
122 p. : ill. ; 30 cmThis thesis delves into the Negative Bias Temperature Instability (NBTI) effect in Metal-OxideSemiconductor (MOS) devices, specifically Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs). The study comprehensively examines
Messaoud, DhiaElhak +1 more
core
Untersuchungen zu durch Schwerionen-Bestrahlung induzierten Materialveränderungen in supraleitenden NbTi-Drähten [PDF]
, 2008 Das geplante Internationale Beschleunigerzentrum FAIR (International Facility for Antiproton and Ion Research) an der GSI wird mit supraleitenden Magneten ausgestattet.
Newirkowez, Aleksandra
core
NBTI-Aware Data Allocation Strategies for Scratchpad Memory Based Embedded Systems [PDF]
, 2011 Papagiannopoulou, D. +10 more
core +1 more source
Continuum fluorescence of Cu in NbTi/Cu composite wires
, 1994 Continuum fluorescence across interfaces separating regions of differing composition is difficult to calculate. This paper illustrates a case of continuum fluorescence in analysis of superconducting NbTi/Cu composite wire which could lead to erroneous ...
Hlava, P. F. +3 more
core
Signal Probability Control for Relieving NBTI in SRAM Cells
, 2010 Negative Bias Temperature Instability (NBTI) is one of the major reliability problems in advanced technologies. NBTI causes threshold voltage degradation in a PMOS transistor which is biased to negative voltage.
Kunitake, Yuji +5 more
core
NBTI analysis on PUF-based differential architectures
Silicon Physical Unclonable Functions (PUFs) haveemerged as novel cryptographic primitives with the ability to generateunique chip identifiers and cryptographic keys by exploitingintrinsic manufacturing process variations.
Zwolinski, Mark +2 more
core +1 more source
Novel Bacterial Topoisomerase Inhibitors: A New Front in an Old War. [PDF]
J Mol BiolMann CA, Dewar JM, Osheroff N.
europepmc +1 more source
Designing the DNA-Intercalating Moiety to Improve the Safety and Efficacy of Novel Bacterial Topoisomerase Inhibitors. [PDF]
J Med ChemZorman M +8 more
europepmc +1 more source