Results 91 to 100 of about 5,324 (209)
Metals, 2018 Ti3Al-Nb alloy (Ti-24Al-15Nb) was welded by a pulsed laser welding system without and with pure Nb filler metal. The results indicated that pure Nb filler metal had profound effects on the microstructures and mechanical properties of the laser-welded ...
Lin Wang +4 more
doaj +1 more source
Temperature-aware NBTI modeling techniques in digital circuits
, 2009 Negative bias temperature instability (NBTI) has become a critical reliability phenomena in advanced CMOS technology. In this paper, we propose an analytical temperature-aware dynamic NBTI model, which can be used in two circuit operation cases ...
Luo, Hong +4 more
core +1 more source
Side peaks in Nb and NbTi point-contact spectra [PDF]
, 2013 Superconductor – normal metal point contacts were investigated, using different combinations of Cu, brass, Nb and NbTi. The resulting spectra contained side peaks.
Huupponen, Jouko
core
Partitioned cache architectures for reduced NBTI-induced aging [PDF]
, 2011 A Calimera +12 more
core +1 more source
Aging Analysis and Degradation Prediction of PLL Circuits in 14-nm FinFET Technology
IEEE Journal of the Electron Devices SocietyThis work investigates the reliability and aging predictions in a 14-nm FinFET-based analog circuit under high-temperature conditions. Aging simulations and accelerated aging tests were carried out on key devices of phase-locked loop (PLL) circuits, with
Meng Li +6 more
doaj +1 more source
NBTI-Aware Data Allocation Strategies for Scratchpad Memory Based Embedded Systems [PDF]
, 2011 Papagiannopoulou, D. +10 more
core +1 more source
On the differences between ultra-fast NBTI measurements and Reaction-Diffusion theory
, 2009 Reaction-Diffusion (R-D) theory, well-known to successfully explain most features of NBTI stress, is perceived to fail in explaining NBTI recovery. Several efforts have been made to understand differences between NBTI relaxation measured using ultra-fast
S. Deora +9 more
core +1 more source
Generation of Minimal Leakage Input Vectors with Constrained NBTI Degradation
, 2009 Technology scaling has caused Negative Bias Temperature Instability (NBTI) to emerge as a major circuit reliability concern. Simultaneously leakage power is becoming a greater fraction of the total power dissipated by logic circuits.
Tudu, Jaynarayan T. +4 more
core +2 more sources
Intrinsic NBTI-variability aware statistical pipeline performance assessment and tuning
, 2009 Random process variation and variability intrinsic to PMOS Negative Bias Temperature Instability (NBTI-induced statistical variation) are two major reliability concerns as transistor dimensions scales with technology.
Oates, Anthony S. +5 more
core +1 more source
Research progress and challenges in the reliability of SiGe channel CMOS device
Gongneng cailiao yu qijian xuebaoAs complementary metal-oxide-semiconductor (CMOS) technology scales down to the 5 nm node and beyond, SiGe channels have become a promising solution for high-performance p-type field-effect transistor (pFET) due to their superior hole mobility, with ...
Guoqixin HUANG +2 more
doaj +1 more source