Results 91 to 100 of about 5,421 (173)

Microstructures and Mechanical Properties of a Laser-Welded Joint of Ti3Al-Nb Alloy Using Pure Nb Filler Metal

open access: yesMetals, 2018
Ti3Al-Nb alloy (Ti-24Al-15Nb) was welded by a pulsed laser welding system without and with pure Nb filler metal. The results indicated that pure Nb filler metal had profound effects on the microstructures and mechanical properties of the laser-welded ...
Lin Wang   +4 more
doaj   +1 more source

Predictive TCAD for NBTI stress-recovery in various device architectures and channel materials

open access: yes, 2017
A 3-D TCAD framework is proposed for simulating Negative Bias Temperature Instability (NBTI) in Silicon (Si) and Silicon Germanium (SiGe) channel p-MOSFETs.
Rao, Rakesh   +17 more
core   +1 more source

Impact of NBTI on the Performance of 35nm CMOS Digital Circuits [PDF]

open access: yes, 2008
The negative bias temperature instability (NBTI) of p-MOSFET has the greatest impact on the long term reliability of nano-scale devices and circuits.
Zwolinski, M   +3 more
core   +1 more source

Partitioned cache architectures for reduced NBTI-induced aging [PDF]

open access: yes, 2011
A Calimera   +12 more
core   +1 more source

Impact of NBTI on EMC behaviours of CMOS inverter

open access: yes, 2010
In this paper the Electromagnetic Robustness (EMR) of a CMOS inverter has been analyzed when the pFETs are submitted to negative bias temperature instability (NBTI).
N. Berbel   +7 more
core   +1 more source

Chemical structures and molecular weights of optimized NBTI hit compounds.

open access: yes, 2020
Chemical structures and molecular weights of optimized NBTI hit compounds.
Carla Vignaroli (407543)   +12 more
core   +1 more source

Aging Analysis and Degradation Prediction of PLL Circuits in 14-nm FinFET Technology

open access: yesIEEE Journal of the Electron Devices Society
This work investigates the reliability and aging predictions in a 14-nm FinFET-based analog circuit under high-temperature conditions. Aging simulations and accelerated aging tests were carried out on key devices of phase-locked loop (PLL) circuits, with
Meng Li   +6 more
doaj   +1 more source

Ring oscillator switching noise under NBTI wearout

open access: yes
In this paper the switching noise of a CMOS ring oscillator has been analysed when their pFETs are subjected to negative bias temperature instability (NBTI).
Morata Cariñena, Marta   +3 more
core  

Research progress and challenges in the reliability of SiGe channel CMOS device

open access: yesGongneng cailiao yu qijian xuebao
As complementary metal-oxide-semiconductor (CMOS) technology scales down to the 5 nm node and beyond, SiGe channels have become a promising solution for high-performance p-type field-effect transistor (pFET) due to their superior hole mobility, with ...
Guoqixin HUANG   +2 more
doaj   +1 more source

Microstructural, Oxidation, and Mechanical Behavior of NbTi-Based Refractory Alloys with 5 to 10 Pct Co, Cr, and Ni Additions

open access: yes
NbTi-based refractory alloys with additions of Co, Cr, and Ni represent an interesting medium-entropy alloy system with potential for protective oxide film formation, high strength, and ductility.
Carter, Jennifer, Kim, Tae Kyong John
core   +1 more source

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