Results 141 to 150 of about 5,324 (209)

A compact, lightweight, variable-energy cyclotron for conventional and FLASH ion beam radiotherapy. [PDF]

Front Oncol
Winklehner D, Minervini JV, Bromberg L, Forton E, Mandrillon J, Michael PC, Radovinsky A.   +6 more
europepmc   +1 more source

Charge Trapping and Emission during Bias Temperature Stressing of Schottky Gate GaN-on-Silicon HEMT Structures Targeting RF/mm Wave Power Amplifiers. [PDF]

Micromachines (Basel)
O'Sullivan B, Rathi A, Alian A, Yadav S, Yu H, Sibaja-Hernandez A, Peralagu U, Parvais B, Chasin A, Collaert N.   +9 more
europepmc   +1 more source

Cooldown and Ramp Test of a Low-Cryogen, Lightweight, Head-Only 7T MRI Magnet. [PDF]

IEEE Trans Appl Supercond
Wu A, Ricci J, Xu M, Soni V, Conte G, Van Epps C, Parizh M, Stautner W, Hua Y, Lee SK, Vermilyea M, Yeo DT, Foo TK.   +12 more
europepmc   +1 more source

4.11 A/1650 V Sapphire-Substrate GaN MIS-HEMTs with Thin Buffer for Medium-Voltage Power Applications. [PDF]

Micromachines (Basel)
Chen C, Liu Y, Zhou X, Li P, Zhang Y, Yang B, Yang Z, Bai J.   +7 more
europepmc   +1 more source

Abstraction NBTI model

it - Information Technology, 2021
AbstractNegative Bias Temperature Instability (NBTI) is one of the major transistor aging effects, possibly leading to timing failures during run-time of a system. Thus one is interested in predicting this effect during design time. In this work an Abstraction NBTI model is introduced reducing the state space of trap-based NBTI models using two ...
Stephan Adolf, Wolfgang Nebel
openaire   +2 more sources