Results 161 to 170 of about 5,421 (173)

Improvement in NBTI Reliability of Si-Passivated Ge/High-k/Metal-Gate pFETs

Microelectronic Engineering, 2009
Philippe Roussel, Ben Kaczer, Jacopo Franco   +2 more
exaly  

NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level Modeling

IEEE Transactions on Electron Devices, 2019
Tibor Grasser, Hans Reisinger, Katja Puschkarsky   +2 more
exaly  

NBTI Effect Survey for Low Power Systems in Ultra-Nanoregime

Current Nanoscience, 2023
exaly  

Review and Reexamination of Reliability Effects Related to NBTI-Induced Statistical Variations

IEEE Transactions on Device and Materials Reliability, 2007
Stewart Rauch
exaly  

The Statistical Analysis of Individual Defects Constituting NBTI and Its Implications for Modeling DC- and AC-Stress

2010
Tibor Grasser, Hans Reisinger, Christian Schlünder   +2 more
exaly  

Effects of Measurement Temperature on NBTI

IEEE Electron Device Letters, 2007
Guido Groeseneken, Jian Fu Zhang, M H Chang   +2 more
exaly  

NbTi Superconducting Wires and Applications

2019
Yanmin Zhu, Kailin Zhang, Ruilong Wang
exaly  

On the Distribution of NBTI Time Constants on a Long, Temperature-Accelerated Time Scale

IEEE Transactions on Electron Devices, 2013
Tibor Grasser, Gregor Pobegen
exaly  

Universality of NBTI - From Devices to Circuits and Products

2014
A Haggag, V Huard
exaly  

A New NBTI Model Based on Hole Trapping and Structural Relaxation in MOS Dielectrics

IEEE Transactions on Electron Devices, 2009
Daniele Ielmini
exaly