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NBTI-Aware Clustered Power Gating
ACM Transactions on Design Automation of Electronic Systems, 2010 The emergence of Negative Bias Temperature Instability (NBTI) as the most relevant source of reliability in sub-90nm technologies has led to a new facet of the traditional trade-off between power and reliability.
Andrea Calimera, Massimo Poncino
exaly +2 more sources
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits [PDF]
Journal of Electronic Testing: Theory and Applications (JETTA), 2016 The Negative Bias Temperature Instability (NBTI) phenomenon is agreed to be one of the main reliability concerns in nanoscale circuits. It increases the threshold voltage of pMOS transistors, thus, slows down signal propagation along logic paths between ...
Giovanni Squillero +2 more
exaly +2 more sources
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Effect of the Ta Addition on Densification and Mechanical Properties of NbTi Alloys Prepared by SPS
Journal of Alloys and Compounds, 2021Guodong Cui
exaly
Recovery Investigation of NBTI-Induced Traps in n-MOSFET Devices
Microelectronics Reliability, 2020Mohamed Boubaaya +2 more
exaly
The Investigation on the Fabrication and Microstructure of NbTi-(NbTi)C Fe-Based Composite
Vacuum, 2019Li-Sheng Zhong
exaly
Impact of NBTI on the Temporal Performance Degradation of Digital Circuits
IEEE Electron Device Letters, 2005Kunhyuk Kang, B C Paul, M A Alam
exaly
A Review of NBTI Mechanisms and Models
Microelectronics Reliability, 2018Souvik Mahapatra, Narendra Parihar
exaly