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NBTI model development with regression analysis
Microelectronics Reliability, 2009In industry, negative bias temperature instability (NBTI) mechanism degradation models are derived from regression analysis of stress data. The model exponents vary for different technologies and manufacturers. We will show that limited sampling (using only one lot) and the misapplication of regression analysis are major contributors to the variation ...
Anastasios A. Katsetos +1 more
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Scaling Law in Superconducting NbTi Alloys
Physica Status Solidi (a), 1978Algebraic expressions are given for the field and temperature dependence of the critical current density jc of superconducting NbTi single-wires with Ti concentrations between 44 and 66 wt%. It is shown that the volume pinning force F obeys a scaling law, i.e. the field dependence of F may be expressed by a function f(h) with h = H/Hc2.
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On the 'permanent' component of NBTI
IEEE International Integrated Reliability Workshop Final Report, 2010Grasser T. +7 more
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Effect of the Ta addition on densification and mechanical properties of NbTi alloys prepared by SPS
Journal of Alloys and Compounds, 2021Guodong Cui
exaly
NBTI Characterization with in Situ Poly Heater
2022 IEEE International Reliability Physics Symposium (IRPS), 2022Yu-Hsing Cheng +2 more
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Recovery investigation of NBTI-induced traps in n-MOSFET devices
Microelectronics Reliability, 2020Mohamed Boubaaya +2 more
exaly
Analog-circuit NBTI degradation and time-dependent NBTI variability
2016Giering, Kay-Uwe +8 more
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Improvement in NBTI reliability of Si-passivated Ge/high-k/metal-gate pFETs
Microelectronic Engineering, 2009Philippe Roussel +2 more
exaly