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Investigation of III-Nitride MEMS Pressure Sensor for High-Temperature Applications. [PDF]

Micromachines (Basel)
Prio MH, Morshed M, Muthusamy L, Raju MSEH, Towfeeq I, Gajula D, Koley G.   +6 more
europepmc   +1 more source

Bucket Handle Injury in Blunt Abdominal Trauma. [PDF]

Clin Pract Cases Emerg Med
Gottam B, McCoy CE.
europepmc   +1 more source

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Physical mechanisms of negative-bias temperature instability

Applied Physics Letters, 2005
We report first-principles calculations that elucidate the mechanisms that underlie key features of negative-bias temperature instability (NBTI). We show that the depassivation of Si–H bonds by protons released in the Si substrate is consistent with the observed increase in interface-trap density.
L. Tsetseris, X. J. Zhou, D. M. Fleetwood, R. D. Schrimpf, S. T. Pantelides   +4 more
openaire   +3 more sources

An analytical model for negative bias temperature instability

Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06, 2006
Negative bias temperature instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, the effect of NBTI has rapidly grown in prominence, forcing designers to resort to a pessimistic design style using guard-banding.
Sanjay Kumar, Chris Kim, Sachin Sapatnekar   +2 more
openaire   +1 more source